Z-profiling of wafers based on X-ray measurements
US-12480898-B2 · Nov 25, 2025 · US
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Shemesh Dror patents
Shemesh Dror is listed as an inventor on 27 patents in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | Shemesh Dror |
| Total patents | 27 |
| First publication | Sep 22, 2016 |
| Latest publication | Nov 25, 2025 |
Notable patents
Publications ranked by popularity score, then publication date.
Nondestructive estimation of structural properties of a specimen via x-ray modelling based on ground truth measurements
US-2025231132-A1 · Jul 17, 2025 · US
Nondestructive estimation of structural properties of a specimen via x-ray modelling based on simulations and ground truth measurements
US-2025216347-A1 · Jul 3, 2025 · US
Non-destructive three-dimensional probing and characterization of specimens
US-2025130185-A1 · Apr 24, 2025 · US
Non-destructive classification of specimens based on energy signature measurements
US-2024255449-A1 · Aug 1, 2024 · US
Defect examination on a semiconductor specimen
US-11961221-B2 · Apr 16, 2024 · US
Non-destructive sem-based depth-profiling of samples
US-2024096591-A1 · Mar 21, 2024 · US
Non-destructive sem-based depth-profiling of samples
US-2024094150-A1 · Mar 21, 2024 · US
Depth-profiling of samples based on x-ray measurements
US-2024085351-A1 · Mar 14, 2024 · US
Z-profiling of wafers based on x-ray measurements
US-2024085356-A1 · Mar 14, 2024 · US
Recent patents
Latest publications not already listed above.
Defect examination on a semiconductor specimen
US-2023114624-A1 · Apr 13, 2023 · US
X-ray based evaluation of a status of a structure of a substrate
US-11543368-B2 · Jan 3, 2023 · US
Determination of defect location for examination of a specimen
US-11423529-B2 · Aug 23, 2022 · US
Determination of defect location for examination of a specimen
US-2021256687-A1 · Aug 19, 2021 · US
X-ray based evaluation of a status of a structure of a substrate
US-2021181128-A1 · Jun 17, 2021 · US
Process monitoring
US-11022565-B2 · Jun 1, 2021 · US
X-ray based evaluation of a status of a structure of a substrate
US-10928336-B1 · Feb 23, 2021 · US
Method for detecting voids and an inspection system
US-10922809-B2 · Feb 16, 2021 · US
X-ray based evaluation of a status of a structure of a substrate
US-2021033550-A1 · Feb 4, 2021 · US
Process monitoring
US-2020355620-A1 · Nov 12, 2020 · US
Imaging of crystalline defects
US-10347462-B2 · Jul 9, 2019 · US
Imaging of crystalline defects
US-2019180975-A1 · Jun 13, 2019 · US
Method for detecting voids and an inspection system
US-2019043183-A1 · Feb 7, 2019 · US
Resolving ambiguities in an energy spectrum
US-9899185-B1 · Feb 20, 2018 · US
Method for detecting voids in interconnects and an inspection system
US-9805909-B1 · Oct 31, 2017 · US
System and method for scanning an object
US-9490101-B2 · Nov 8, 2016 · US
System and method for scanning an object
US-2016276127-A1 · Sep 22, 2016 · US
Major assignees
Companies most often associated with this inventor's publications.
| Assignee | Patents |
|---|---|
| Applied Materials Israel Ltd | 27 |
| Applied Materials Inc | 2 |
| Applied Mat Isreal Ltd | 1 |
Top CPC classifications
Most common classification codes across this inventor's patents.
| CPC | Patents |
|---|---|
| G01N23/2252 | 13 |
| G01N2223/6116 | 8 |
| H01J37/28 | 8 |
| H01J37/222 | 7 |
| G01N2223/418 | 7 |