Embedded system to characterize BTI degradation effects in MOSFETs
US-12416663-B1 · Sep 16, 2025 · US
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Saxena Sharad patents
Saxena Sharad is listed as an inventor on 7 patents in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | Saxena Sharad |
| Total patents | 7 |
| First publication | Jun 27, 2017 |
| Latest publication | Sep 16, 2025 |
Notable patents
Publications ranked by popularity score, then publication date.
Test structures for measuring silicon thickness in fully depleted silicon-on-insulator technologies
US-10852337-B2 · Dec 1, 2020 · US
Method for applying charge-based-capacitance-measurement with switches using only NMOS or only PMOS transistors
US-10641804-B1 · May 5, 2020 · US
Test structures and method for electrical measurement of FinFET fin height
US-10529631-B1 · Jan 7, 2020 · US
Method for accurate measurement of leaky capacitors using charge based capacitance measurements
US-9952268-B1 · Apr 24, 2018 · US
Test structures for measuring silicon thickness in fully depleted silicon-on-insulator technologies
US-2017309524-A1 · Oct 26, 2017 · US
Test structures and methods for measuring silicon thickness in fully depleted silicon-on-insulator technologies
US-9691669-B1 · Jun 27, 2017 · US
Recent patents
Latest publications not already listed above.
No data yet.
Major assignees
Companies most often associated with this inventor's publications.
| Assignee | Patents |
|---|---|
| Pdf Solutions Inc | 7 |
| Quarantelli Michele | 1 |
| Piadena Alberto | 1 |
| Brozek Tomasz | 1 |
| Hess Christopher | 1 |
Top CPC classifications
Most common classification codes across this inventor's patents.
| CPC | Patents |
|---|---|
| G01R27/2605 | 5 |
| H10P74/207 | 4 |
| H10P74/277 | 4 |
| G01B2210/56 | 4 |
| G01B7/08 | 3 |