Bandgap measurements of patterned film stacks using spectroscopic metrology
US-11796390-B2 · Oct 24, 2023 · US
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Rosenberg Aaron patents
Rosenberg Aaron is listed as an inventor on 11 patents in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | Rosenberg Aaron |
| Total patents | 11 |
| First publication | Mar 14, 2017 |
| Latest publication | Oct 24, 2023 |
Notable patents
Publications ranked by popularity score, then publication date.
Scatterometry based methods and systems for measurement of strain in semiconductor structures
US-11573077-B2 · Feb 7, 2023 · US
Bandgap Measurements of Patterned Film Stacks Using Spectroscopic Metrology
US-2022349752-A1 · Nov 3, 2022 · US
Bandgap measurements of patterned film stacks using spectroscopic metrology
US-11378451-B2 · Jul 5, 2022 · US
Scatterometry Based Methods And Systems For Measurement Of Strain In Semiconductor Structures
US-2021293532-A1 · Sep 23, 2021 · US
Scatterometry based methods and systems for measurement of strain in semiconductor structures
US-11060846-B2 · Jul 13, 2021 · US
Scatterometry Based Methods And Systems For Measurement Of Strain In Semiconductor Structures
US-2020200525-A1 · Jun 25, 2020 · US
Distal femoral knee prostheses
US-10433966-B2 · Oct 8, 2019 · US
Bandgap Measurements of Patterned Film Stacks Using Spectroscopic Metrology
US-2019041266-A1 · Feb 7, 2019 · US
Distal femoral knee prostheses
US-2017156872-A1 · Jun 8, 2017 · US
Recent patents
Latest publications not already listed above.
Distal femoral knee prostheses
US-9592127-B2 · Mar 14, 2017 · US
Major assignees
Companies most often associated with this inventor's publications.
| Assignee | Patents |
|---|---|
| Kla Corp | 7 |
| Zimmer Inc | 3 |
| Kla Tencor Corp | 2 |
| Earl Brian D | 1 |
| Habegger Abraham P | 1 |
Top CPC classifications
Most common classification codes across this inventor's patents.
| CPC | Patents |
|---|---|
| G01N21/956 | 8 |
| G01J3/18 | 4 |
| G01J3/28 | 4 |
| G01N21/21 | 4 |
| G01N21/25 | 4 |