Wafer inspection using a dynamic scan plan
US-2025182266-A1 · Jun 5, 2025 · US
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Nir Zvi patents
Nir Zvi is listed as an inventor on 4 patents in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | Nir Zvi |
| Total patents | 4 |
| First publication | Jan 12, 2017 |
| Latest publication | Jun 5, 2025 |
Notable patents
Publications ranked by popularity score, then publication date.
System and method for scanning an object with an electron beam using overlapping scans and electron beam counter-deflection
US-10541104-B2 · Jan 21, 2020 · US
Charged particle beam device, charged particle beam influencing device, and method of operating a charged particle beam device
US-2019019649-A1 · Jan 17, 2019 · US
System and method for scanning an object with an electron beam
US-2017011883-A1 · Jan 12, 2017 · US
Recent patents
Latest publications not already listed above.
No data yet.
Major assignees
Companies most often associated with this inventor's publications.
| Assignee | Patents |
|---|---|
| Applied Materials Israel Ltd | 3 |
| Ict Integrated Circuit Testing Ges Fuer Halbleiterprueftechnik Mbh | 1 |
Top CPC classifications
Most common classification codes across this inventor's patents.
| CPC | Patents |
|---|---|
| H01J37/28 | 3 |
| H01J37/147 | 3 |
| H01J2237/2813 | 2 |
| H01J2237/20221 | 2 |
| H01J37/265 | 2 |