Determination of layer properties using widening of an electron beam
US-2025216346-A1 · Jul 3, 2025 · US
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Meiry Ron patents
Meiry Ron is listed as an inventor on 3 patents in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | Meiry Ron |
| Total patents | 3 |
| First publication | Jan 26, 2023 |
| Latest publication | Jul 3, 2025 |
Notable patents
Publications ranked by popularity score, then publication date.
Lateral recess measurement in a semiconductor specimen
US-11921063-B2 · Mar 5, 2024 · US
Lateral recess measurement in a semiconductor specimen
US-2023023363-A1 · Jan 26, 2023 · US
Recent patents
Latest publications not already listed above.
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Major assignees
Companies most often associated with this inventor's publications.
| Assignee | Patents |
|---|---|
| Applied Materials Israel Ltd | 3 |
Top CPC classifications
Most common classification codes across this inventor's patents.
| CPC | Patents |
|---|---|
| H10P74/23 | 3 |
| H10P74/203 | 3 |
| G01N23/2251 | 3 |
| H01J37/28 | 3 |
| G01N2223/6116 | 3 |