X-ray methods and systems for semiconductor substrate alignment
US-2025305971-A1 · Oct 2, 2025 · US
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Machuca Francisco patents
Machuca Francisco is listed as an inventor on 7 patents in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | Machuca Francisco |
| Total patents | 7 |
| First publication | Jan 28, 2020 |
| Latest publication | Oct 2, 2025 |
Notable patents
Publications ranked by popularity score, then publication date.
Sub-millisecond optical detection of pulsed plasma processes
US-2025157801-A1 · May 15, 2025 · US
Hybrid x-ray and optical metrology and navigation
US-2025060324-A1 · Feb 20, 2025 · US
Hybrid modeling for film metrology
US-2024419885-A1 · Dec 19, 2024 · US
Roentgen integrated metrology for hybrid bonding process control in ultra high 3d integration
US-2024387448-A1 · Nov 21, 2024 · US
Advanced OES Characterization
US-2024339309-A1 · Oct 10, 2024 · US
Disposable liquid chemical sensor system
US-10545087-B2 · Jan 28, 2020 · US
Recent patents
Latest publications not already listed above.
No data yet.
Major assignees
Companies most often associated with this inventor's publications.
| Assignee | Patents |
|---|---|
| Tokyo Electron Ltd | 6 |
| Entegris Inc | 1 |
Top CPC classifications
Most common classification codes across this inventor's patents.
| CPC | Patents |
|---|---|
| G01N23/223 | 2 |
| G01N2223/6116 | 2 |
| H01J37/32972 | 2 |
| H01J37/32963 | 2 |
| G01N23/201 | 1 |