Method for detecting overlay precision and method for compensating overlay deviation
US-11988968-B2 · May 21, 2024 · US
Ma Qiliang is listed as an inventor on 2 patents in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | Ma Qiliang |
| Total patents | 2 |
| First publication | Jul 8, 2021 |
| Latest publication | May 21, 2024 |
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Companies most often associated with this inventor's publications.
| Assignee | Patents |
|---|---|
| Semiconductor Mfg Int Shanghai Corp | 2 |
| Semiconductor Mfg Int Beijing Corp | 2 |
Most common classification codes across this inventor's patents.
| CPC | Patents |
|---|---|
| H10P74/23 | 2 |
| H10W46/301 | 2 |
| H10P74/203 | 2 |
| H10W46/00 | 2 |
| G06T2207/30148 | 2 |