Method for determining parameters in on-wafer calibration piece model
US-11971451-B2 · Apr 30, 2024 · US
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Luan Peng patents
Luan Peng is listed as an inventor on 8 patents in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | Luan Peng |
| Total patents | 8 |
| First publication | Jun 17, 2021 |
| Latest publication | Apr 30, 2024 |
Notable patents
Publications ranked by popularity score, then publication date.
Two-port on-wafer calibration piece circuit model and method for determining parameters
US-11733298-B2 · Aug 22, 2023 · US
Preparation method for piezoelectric composite material, and application thereof
US-2023189651-A1 · Jun 15, 2023 · US
Method for Calibrating Crosstalk Errors in System for Measuring on-Wafer S Parameters and Electronic Device
US-2023051442-A1 · Feb 16, 2023 · US
Calibration method and terminal equipment of terahertz frequency band on-wafer S parameter
US-11385175-B2 · Jul 12, 2022 · US
Two-Port On-Wafer Calibration Piece Circuit Model and Method for Determining Parameters
US-2022107361-A1 · Apr 7, 2022 · US
Method for Determining Parameters in On-Wafer Calibration Piece Model
US-2022099736-A1 · Mar 31, 2022 · US
Calibration method and terminal equipment of terahertz frequency band on-wafer s parameter
US-2021181102-A1 · Jun 17, 2021 · US
Recent patents
Latest publications not already listed above.
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Major assignees
Companies most often associated with this inventor's publications.
| Assignee | Patents |
|---|---|
| The 13Th Research Institute Of China Electronics Tech Group Corporation | 7 |
| Univ Xi An Jiaotong | 1 |
Top CPC classifications
Most common classification codes across this inventor's patents.
| CPC | Patents |
|---|---|
| G01R35/005 | 7 |
| G01R27/32 | 7 |
| G01R31/3191 | 4 |
| G01N2021/3568 | 3 |
| G01R31/2822 | 2 |