Multiple core analysis mode for defect analysis
US-10664370-B2 · May 26, 2020 · US
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Lee Takuya patents
Lee Takuya is listed as an inventor on 5 patents in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | Lee Takuya |
| Total patents | 5 |
| First publication | Dec 20, 2018 |
| Latest publication | May 26, 2020 |
Notable patents
Publications ranked by popularity score, then publication date.
Semiconductor device
US-10656201-B2 · May 19, 2020 · US
Semiconductor device
US-2019004914-A1 · Jan 3, 2019 · US
Semiconductor device
US-2019004110-A1 · Jan 3, 2019 · US
Semiconductor device and method of testing semiconductor device
US-2018364297-A1 · Dec 20, 2018 · US
Recent patents
Latest publications not already listed above.
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Major assignees
Companies most often associated with this inventor's publications.
| Assignee | Patents |
|---|---|
| Renesas Electronics Corp | 5 |
Top CPC classifications
Most common classification codes across this inventor's patents.
| CPC | Patents |
|---|---|
| G06F11/2242 | 2 |
| G06F11/1629 | 2 |
| G06F11/26 | 2 |
| G01R31/31705 | 2 |
| G06F11/2236 | 2 |