Plating methods for modular and/or ganged waveguides for automatic test equipment for semiconductor testing
US-10944148-B2 · Mar 9, 2021 · US
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Lee Don patents
Lee Don is listed as an inventor on 8 patents in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | Lee Don |
| Total patents | 8 |
| First publication | Aug 10, 2017 |
| Latest publication | Mar 9, 2021 |
Notable patents
Publications ranked by popularity score, then publication date.
Wave interface assembly for automatic test equipment for semiconductor testing
US-10393772-B2 · Aug 27, 2019 · US
Multiple waveguide structure with single flange for automatic test equipment for semiconductor testing
US-10381707-B2 · Aug 13, 2019 · US
Integrated waveguide structure and socket structure for millimeter waveband testing
US-10114067-B2 · Oct 30, 2018 · US
Multiple waveguide structure with single flange for automatic test equipment for semiconductor testing
US-2017229753-A1 · Aug 10, 2017 · US
Integrated waveguide structure and socket structure for millimeter waveband testing
US-2017227598-A1 · Aug 10, 2017 · US
Wave interface assembly for automatic test equipment for semiconductor testing
US-2017229754-A1 · Aug 10, 2017 · US
Plating methods for modular and/or ganged waveguides for automatic test equipment for semiconductor testing
US-2017229757-A1 · Aug 10, 2017 · US
Recent patents
Latest publications not already listed above.
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Major assignees
Companies most often associated with this inventor's publications.
| Assignee | Patents |
|---|---|
| Advantest Corp | 8 |
Top CPC classifications
Most common classification codes across this inventor's patents.
| CPC | Patents |
|---|---|
| G01R31/2886 | 8 |
| G01R31/2834 | 7 |
| H01P11/002 | 6 |
| H01P1/04 | 6 |
| H01P3/121 | 6 |