Semiconductor structure inspection method, extreme ultraviolet (euv) mask inspection method, and euv lithography method
US-2025164872-A1 · May 22, 2025 · US
Lee Chihoon is listed as an inventor on 18 patents in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | Lee Chihoon |
| Total patents | 18 |
| First publication | Jul 21, 2015 |
| Latest publication | May 22, 2025 |
Publications ranked by popularity score, then publication date.
US-2025164872-A1 · May 22, 2025 · US
US-11486834-B2 · Nov 1, 2022 · US
US-11004712-B2 · May 11, 2021 · US
US-10970461-B2 · Apr 6, 2021 · US
US-2020209165-A1 · Jul 2, 2020 · US
US-2020176292-A1 · Jun 4, 2020 · US
US-2020042576-A1 · Feb 6, 2020 · US
US-10496732-B2 · Dec 3, 2019 · US
US-10338954-B2 · Jul 2, 2019 · US
US-9906727-B2 · Feb 27, 2018 · US
Latest publications not already listed above.
US-9898111-B2 · Feb 20, 2018 · US
US-2017351544-A1 · Dec 7, 2017 · US
US-2017131865-A1 · May 11, 2017 · US
US-9323432-B2 · Apr 26, 2016 · US
US-9298971-B2 · Mar 29, 2016 · US
US-2015316983-A1 · Nov 5, 2015 · US
US-9092051-B2 · Jul 28, 2015 · US
US-D734769-S · Jul 21, 2015 · US
Companies most often associated with this inventor's publications.
| Assignee | Patents |
|---|---|
| Samsung Electronics Co Ltd | 21 |
Most common classification codes across this inventor's patents.
| CPC | Patents |
|---|---|
| G06F3/14 | 9 |
| G06F3/048 | 4 |
| H10P72/0616 | 4 |
| H01L21/67288 | 4 |
| G06F2203/04807 | 4 |