Maintenance work support system, control method, and non-transitory computer-readable recording medium storing control program
US-2026004258-A1 · Jan 1, 2026 · US
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Kim Hyejin patents
Kim Hyejin is listed as an inventor on 7 patents in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | Kim Hyejin |
| Total patents | 7 |
| First publication | Mar 8, 2018 |
| Latest publication | Jan 1, 2026 |
Notable patents
Publications ranked by popularity score, then publication date.
Electron microscope and method of adjusting focus of electron microscope
US-11670479-B2 · Jun 6, 2023 · US
Scanning electron microscope and method for measuring pattern
US-11276554-B2 · Mar 15, 2022 · US
Electron microscope and method of adjusting focus of electron microscope
US-2021384006-A1 · Dec 9, 2021 · US
Scanning electron microscope and method for measuring pattern
US-2021043420-A1 · Feb 11, 2021 · US
Scanning microscope with controlled variable measurement parameters
US-10338367-B2 · Jul 2, 2019 · US
Scanning microscope
US-2018067294-A1 · Mar 8, 2018 · US
Recent patents
Latest publications not already listed above.
No data yet.
Major assignees
Companies most often associated with this inventor's publications.
| Assignee | Patents |
|---|---|
| Hitachi High Tech Corp | 4 |
| Hitachi Ltd | 2 |
| Tokyo Electron Ltd | 1 |
Top CPC classifications
Most common classification codes across this inventor's patents.
| CPC | Patents |
|---|---|
| H01J37/28 | 6 |
| H01J37/20 | 4 |
| H01J37/12 | 4 |
| G01N23/2251 | 2 |
| H01J37/10 | 2 |