AC-Coupled System for Particle Detection
US-2021074534-A1 · Mar 11, 2021 · US
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Kaz David patents
Kaz David is listed as an inventor on 6 patents in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | Kaz David |
| Total patents | 6 |
| First publication | Feb 16, 2017 |
| Latest publication | Mar 11, 2021 |
Notable patents
Publications ranked by popularity score, then publication date.
Method and system for edge-of-wafer inspection and review
US-10770258-B2 · Sep 8, 2020 · US
Method and System for Edge-of-Wafer Inspection and Review
US-2019006143-A1 · Jan 3, 2019 · US
Method and system for edge-of-wafer inspection and review
US-10056224-B2 · Aug 21, 2018 · US
System and method for cathodoluminescence-based semiconductor wafer defect inspection
US-10018579-B1 · Jul 10, 2018 · US
Method and System for Edge-of-Wafer Inspection and Review
US-2017047193-A1 · Feb 16, 2017 · US
Recent patents
Latest publications not already listed above.
No data yet.
Major assignees
Companies most often associated with this inventor's publications.
| Assignee | Patents |
|---|---|
| Kla Tencor Corp | 5 |
| Agilent Technologies Inc | 1 |
Top CPC classifications
Most common classification codes across this inventor's patents.
| CPC | Patents |
|---|---|
| H01J2237/1534 | 4 |
| G01N21/9501 | 4 |
| H01J2237/1536 | 4 |
| H01J2237/1532 | 4 |
| H01J37/153 | 4 |