Semiconductor wafer inspection apparatus and semiconductor wafer inspection method
US-9869715-B2 · Jan 16, 2018 · US
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Ishimoto Takashi patents
Ishimoto Takashi is listed as an inventor on 2 patents in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | Ishimoto Takashi |
| Total patents | 2 |
| First publication | Jan 12, 2017 |
| Latest publication | Jan 16, 2018 |
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Major assignees
Companies most often associated with this inventor's publications.
| Assignee | Patents |
|---|---|
| Tokyo Seimitsu Co Ltd | 2 |
Top CPC classifications
Most common classification codes across this inventor's patents.
| CPC | Patents |
|---|---|
| H10P72/7612 | 2 |
| H10P72/0436 | 2 |
| H10P72/0434 | 2 |
| H10P72/0432 | 2 |
| H10P72/70 | 2 |