Apparatus for a charged particle beam device, charged particle beam device, method of analyzing a magnetic lens for a charged particle beam device, and non-transitory medium
US-2026066214-A1 · Mar 5, 2026 · US
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Idan Tamir patents
Idan Tamir is listed as an inventor on 1 patent in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | Idan Tamir |
| Total patents | 1 |
| First publication | Mar 5, 2026 |
| Latest publication | Mar 5, 2026 |
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Major assignees
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| Assignee | Patents |
|---|---|
| Ict Integrated Circuit Testing Ges Fuer Halbleiterprueftechnik Mbh | 1 |
Top CPC classifications
Most common classification codes across this inventor's patents.
| CPC | Patents |
|---|---|
| H01J37/141 | 1 |