Jig and sample processing method
US-2025037964-A1 · Jan 30, 2025 · US
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Hirota Jun patents
Hirota Jun is listed as an inventor on 24 patents in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | Hirota Jun |
| Total patents | 24 |
| First publication | Feb 26, 2015 |
| Latest publication | Jan 30, 2025 |
Notable patents
Publications ranked by popularity score, then publication date.
Alignment device and lens alignment system
US-12153275-B2 · Nov 26, 2024 · US
Alignment device and lens alignment system
US-2022026661-A1 · Jan 27, 2022 · US
Semiconductor measurement device and method of measuring semiconductor
US-11060990-B2 · Jul 13, 2021 · US
Mounting structure of bearing member and speed reducing apparatus
US-11009067-B2 · May 18, 2021 · US
Projector apparatus
US-10859895-B2 · Dec 8, 2020 · US
Lens moving mechanism
US-10718927-B2 · Jul 21, 2020 · US
Lens moving mechanism
US-10712528-B2 · Jul 14, 2020 · US
Lens moving mechanism
US-10606024-B2 · Mar 31, 2020 · US
Measuring method of scanning probe microscopy using penetrative pressing force
US-10545170-B2 · Jan 28, 2020 · US
Recent patents
Latest publications not already listed above.
Mounting structure of bearing member and speed reducing apparatus
US-2020003255-A1 · Jan 2, 2020 · US
Projector apparatus
US-2019353991-A1 · Nov 21, 2019 · US
Lens moving mechanism
US-2019339483-A1 · Nov 7, 2019 · US
Printing method, sound control system, and program
US-10437526-B2 · Oct 8, 2019 · US
Semiconductor measurement device and method of measuring semiconductor
US-2019293586-A1 · Sep 26, 2019 · US
Lens moving mechanism
US-2019258023-A1 · Aug 22, 2019 · US
Lens moving mechanism
US-2019250365-A1 · Aug 15, 2019 · US
Scanning probe microscope and measurement method using the same
US-10345336-B2 · Jul 9, 2019 · US
Printing method, sound control system, and program
US-2019102116-A1 · Apr 4, 2019 · US
Scanning probe microscope and measurement method using the same
US-2017269123-A1 · Sep 21, 2017 · US
Measuring method of scanning probe microscopy
US-2016377651-A1 · Dec 29, 2016 · US
Storage device
US-2016379709-A1 · Dec 29, 2016 · US
Scanning probe microscope
US-9410983-B2 · Aug 9, 2016 · US
Scanning probe microscope
US-2015059025-A1 · Feb 26, 2015 · US
Major assignees
Companies most often associated with this inventor's publications.
| Assignee | Patents |
|---|---|
| Thk Co Ltd | 12 |
| Toshiba Kk | 5 |
| Toshiba Memory Corp | 4 |
| Nec Display Solutions Ltd | 2 |
| Canon Kk | 2 |
Top CPC classifications
Most common classification codes across this inventor's patents.
| CPC | Patents |
|---|---|
| G03B21/142 | 10 |
| G02B7/023 | 8 |
| G02B7/04 | 6 |
| G03B21/145 | 6 |
| G01Q60/30 | 6 |