Method of Analyzing Metrology Data
US-2023400781-A1 · Dec 14, 2023 · US
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Hand Sean patents
Hand Sean is listed as an inventor on 9 patents in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | Hand Sean |
| Total patents | 9 |
| First publication | Aug 27, 2015 |
| Latest publication | Dec 14, 2023 |
Notable patents
Publications ranked by popularity score, then publication date.
AFM imaging with metrology-preserving real time denoising
US-11796565-B2 · Oct 24, 2023 · US
AFM imaging with creep correction
US-11714104-B2 · Aug 1, 2023 · US
AFM imaging with real time drift correction
US-11604210-B2 · Mar 14, 2023 · US
AFM Imaging with Real Time Drift Correction
US-2023009857-A1 · Jan 12, 2023 · US
AFM Imaging with Creep Correction
US-2022381803-A1 · Dec 1, 2022 · US
AFM Imaging with Metrology-Preserving Real Time Denoising
US-2022326277-A1 · Oct 13, 2022 · US
Precise probe placement in automated scanning probe microscopy systems
US-9995763-B2 · Jun 12, 2018 · US
Precise probe placement in automated scanning probe microscopy systems
US-2015241469-A1 · Aug 27, 2015 · US
Recent patents
Latest publications not already listed above.
No data yet.
Major assignees
Companies most often associated with this inventor's publications.
| Assignee | Patents |
|---|---|
| Bruker Nano Inc | 9 |
Top CPC classifications
Most common classification codes across this inventor's patents.