Time-of-flight mass analysers
US-12592373-B2 · Mar 31, 2026 · US
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Grinfeld Dmitry patents
Grinfeld Dmitry is listed as an inventor on 76 patents in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | Grinfeld Dmitry |
| Total patents | 76 |
| First publication | Jan 29, 2015 |
| Latest publication | Mar 31, 2026 |
Notable patents
Publications ranked by popularity score, then publication date.
Multi-reflection mass spectrometer
US-2026074172-A1 · Mar 12, 2026 · US
Ion Transport between Ion Optical Devices at Different Gas Pressures
US-2026045469-A1 · Feb 12, 2026 · US
High resolution multi-reflection time-of-flight mass analyser
US-2026011543-A1 · Jan 8, 2026 · US
Ion trap with elongated electrodes
US-12518958-B2 · Jan 6, 2026 · US
Time of Flight mass analyser and method of Time of Flight mass spectrometry
US-12518956-B2 · Jan 6, 2026 · US
Method for determining abundance of ions
US-2025372362-A1 · Dec 4, 2025 · US
Ion accumulation control for analytical instrument
US-2025364238-A1 · Nov 27, 2025 · US
Ion transport between ion optical devices at different gas pressures
US-12476098-B2 · Nov 18, 2025 · US
High resolution multi-reflection time-of-flight mass analyser
US-12469691-B2 · Nov 11, 2025 · US
Recent patents
Latest publications not already listed above.
Electrostatic ion trap configuration
US-2025343038-A1 · Nov 6, 2025 · US
Voltage supply for a mass analyser
US-12444596-B2 · Oct 14, 2025 · US
Ion accumulation control for analytical instrument
US-12437984-B2 · Oct 7, 2025 · US
Electrostatic ion trap configuration
US-12387925-B2 · Aug 12, 2025 · US
Multi-reflection time-of-flight mass analyser with independent trapping region
US-2025218760-A1 · Jul 3, 2025 · US
Method for correcting mass spectral data
US-12340999-B2 · Jun 24, 2025 · US
Charge detection for ion accumulation control
US-12300481-B2 · May 13, 2025 · US
Multi-reflection mass spectrometer
US-2025062111-A1 · Feb 20, 2025 · US
Method for calibrating a time-of-flight mass analyser and time-of-flight mass analyser
US-2024395520-A1 · Nov 28, 2024 · US
Multi-reflection mass spectrometer
US-2024395531-A1 · Nov 28, 2024 · US
Charge detection mass spectrometry utilizing harmonic oscillation and selective temporal overview of resonant ion (stori) plots
US-2024387159-A1 · Nov 21, 2024 · US
Methods for performing charge detection mass spectrometry with temporal resolution
US-2024371621-A1 · Nov 7, 2024 · US
Ion Trap with Elongated Electrodes
US-2024331996-A1 · Oct 3, 2024 · US
Collision cross section measurement in time-of-flight mass analyser
US-2024312775-A1 · Sep 19, 2024 · US
Voltage Supply for a Mass Analyser
US-2024249931-A1 · Jul 25, 2024 · US
Ion Beam Focusing
US-2024249930-A1 · Jul 25, 2024 · US
Interface ion guide
US-2024203718-A1 · Jun 20, 2024 · US
Method of gain calibration
US-11996277-B2 · May 28, 2024 · US
Ion trap
US-11990329-B2 · May 21, 2024 · US
Voltage supply for a mass analyser
US-11972938-B2 · Apr 30, 2024 · US
Major assignees
Companies most often associated with this inventor's publications.
| Assignee | Patents |
|---|---|
| Thermo Fisher Scient Bremen Gmbh | 58 |
| Thermo Fisher Scient (Bremen) Gmbh | 9 |
| Thermo Fisher Scient Bremen | 9 |
| California Inst Of Techn | 4 |
| Thermo Finnigan Llc | 2 |
Top CPC classifications
Most common classification codes across this inventor's patents.
| CPC | Patents |
|---|---|
| H01J49/406 | 40 |
| H01J49/0031 | 30 |
| H01J49/40 | 25 |
| H01J49/4245 | 22 |
| H01J49/061 | 21 |