Voltage supply for a mass analyser

Patent metadata

Field	Value
Publication number	US-12444596-B2
Application number	US-202418624417-A
Country	US
Kind code	B2
Filing date	Apr 2, 2024
Priority date	Jun 2, 2021
Publication date	Oct 14, 2025
Grant date	Oct 14, 2025

Abstract

A voltage supply for a mass analyser is provided. The voltage supply comprises a voltage source, a first voltage output, a second voltage output, and a voltage divider network. The first voltage output is configured to provide a first voltage to a first electrode of the mass analyser, wherein the first electrode of the mass analyser has a first mass shift per volt perturbation. The second voltage output is configured to provide a second voltage to a second electrode of the mass analyser, wherein the second electrode of the mass analyser has a second mass shift per volt perturbation. The second mass shift per volt perturbation opposes the first mass shift per volt perturbation. The voltage divider network comprises a first resistor and a second resistor.

First claim

The invention claimed is:

1. A mass analyser comprising:
an ion source configured to output ions along an ion trajectory;
an ion detector configured to detect ions along the ion trajectory;
a plurality of electrodes arranged along the ion trajectory, each electrode of the plurality of electrodes having an associated mass shift per volt perturbation;
a jitter compensating electrode arranged along the ion trajectory; and
a voltage source connected to the plurality of electrodes and the jitter compensating electrode,
wherein the jitter compensating electrode has a mass shift per volt perturbation configured to compensate for a net mass shift per volt perturbation of the plurality of electrodes.

2. A mass analyser according to claim 1 , further comprising
a capacitive coupling circuit configured to connect the jitter compensating electrode to the voltage source.

3. A mass analyser according to claim 1 , wherein
a length of the jitter compensating electrode aligned with the ion trajectory is configured to provide the mass shift per volt perturbation to compensate for the net mass shift per volt perturbation of the plurality of electrodes.

4. A mass analyser according to claim 1 , wherein
the jitter compensating electrode is a jitter compensating electrode assembly,
the jitter compensating electrode assembly comprises a plurality of ring electrodes, each ring electrode being arranged about the ion trajectory, wherein the plurality of ring electrodes are connected to either the voltage source, or to ground in an alternating manner along the ion trajectory.

5. A mass analyser according to claim 1 , wherein
the jitter compensating electrode comprises a plate electrode.

6. A mass analyser according to claim 1 , wherein
the jitter compensating electrode comprises a cylindrical mesh electrode configured to surround the ion trajectory.

7. A mass analyser according to claim 1 , wherein
the plurality of electrodes comprises a first electrode arranged along the ion trajectory, the first electrode having a first mass shift per volt perturbation; and
the plurality of electrodes comprises a second electrode arranged along the ion trajectory, the second electrode having a second mass shift per volt perturbation, wherein the second mass shift per volt perturbation opposes the first mass shift per volt perturbation.

8. A mass analyser according to claim 7 , wherein
the first electrode of the mass analyser has a first mass shift per volt perturbation of at least 0.001 ppm/mV; and
the second electrode of the mass analyser has a second mass shift per volt perturbation of at least −0.001 ppm/mV.

9. A mass analyser according to claim 7 , wherein the voltage source is provided as part of a voltage supply, the voltage supply comprising:
the voltage source;
a first voltage output configured to provide a first voltage to the first electrode;
a second voltage output configured to provide a second voltage to the second electrode; and
a voltage divider network connected to the first voltage output, the second voltage output, and the voltage source, the voltage divider network comprising:
a first resistor configured to define the first voltage, the first resistor having a first temperature coefficient; and
a second resistor configured to define the second voltage, the second resistor having a second temperature coefficient, wherein the second temperature coefficient is selected based on the first and second mass shift per volt perturbations and the first temperature coefficient such that a first mass shift associated with the first electrode is compensated by a second mass shift associated with the second electrode.

10. A mass analyser according to claim 9 , wherein the voltage source is provided as part of a voltage supply, the voltage supply comprising:
the voltage source;
a first voltage output configured to provide a first voltage to the first electrode;
a second voltage output configured to provide a second voltage to the second electrode; and
a voltage divider network connected to the first voltage output, the second voltage output, and the voltage source, the voltage divider network comprising:
a first resistor configured to define the first voltage, the first resistor having a first ageing coefficient; and
a second resistor configured to define the second voltage, the second resistor having a second ageing coefficient, wherein the second ageing coefficient is selected based on the first and second mass shift per volt perturbations and the first ageing coefficient such that a first mass shift associated with the first electrode is compensated by a second mass shift associated with the second electrode.

11. A mass analyser according to claim 9 , wherein
the first temperature coefficient of the first resistor is different to the second temperature coefficient of the second resistor; or
a mass analyser according to claim 10 , wherein
the first ageing coefficient of the first resistor is different to the second ageing coefficient of the second resistor.

12. A voltage supply according to claim 9 , wherein
the first resistor has a first temperature coefficient and a first ageing coefficient, and
the second resistor has a second temperature coefficient and a second ageing coefficient, wherein the second temperature coefficient and the second ageing coefficient are selected based on the first and second mass shift per volt perturbations, the first temperature coefficient, and the first ageing coefficient such that a first mass shift associated with the first electrode is compensated by a second mass shift associated with the second electrode.

13. A mass analyser according to claim 9 , wherein
the first temperature coefficient of the first resistor is no greater than 50 ppm/K or the first ageing coefficient of the first resistor is no greater than 50 ppm/week.

14. A mass analyser according to claim 9 , wherein
the first voltage output is a first DC voltage output; and/or
the second voltage output is a second DC voltage output.

15. A mass analyser according to claim 9 , wherein
the jitter compensating electrode is connected to the voltage source in parallel with the voltage divider network.

16. A mass analyser according to claim 1 , wherein
the mass analyser comprises a Time of Flight (ToF) mass analyser, wherein the ion detector, the plurality of electrodes, and the jitter compensating electrode are provided within the ToF mass analyser.

17. A mass analyser according to claim 1 , wherein
the mass analyser comprises an ion mirror comprising at least some of the plurality of electrodes.

18. A mass analyser according to claim 1 , wherein
the plurality of electrodes are arranged to define a first converging ion mirror and a second converging ion mirror, the first and second converging ion mirrors arranged opposite each other in order to define an ion trajectory which involves multiple reflections between the first and second converging ion mirrors.

19. A mass analyser according to claim 18 , further comprising
an additional jitter compensating electrode, wherein
the jitter compensating electrode is arranged adjacent to the first converging ion mirror and the additional jitter compensating electrode is arranged adjacent to the second converging ion mirror, each of the jitter compensating electrodes being configured to compensate for a net mass shift per volt perturbation associated with the respective converging ion mirror.

20. A mass analyser according to claim 1 , wherein
the

Assignees

• Thermo Fisher Scient Bremen Gmbh

Inventors

• Stewart Hamish
• Grinfeld Dmitry
• Cochems Philipp

Classifications

• H01J49/06

  Electron- or ion-optical arrangements · CPC title

• H01J49/425

  with a logarithmic radial electric potential, e.g. orbitraps · CPC title

• H01J49/406

  with multiple reflections · CPC title

• H01J49/405

  characterised by the reflectron, e.g. curved field, electrode shapes · CPC title

• H01J49/40 Primary

  Time-of-flight spectrometers (H01J49/36 takes precedence) · CPC title