Technique for measuring overlay between layers of a multilayer structure
US-10354376-B2 · Jul 16, 2019 · US
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Goldman Ran patents
Goldman Ran is listed as an inventor on 8 patents in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | Goldman Ran |
| Total patents | 8 |
| First publication | Dec 27, 2016 |
| Latest publication | Jul 16, 2019 |
Notable patents
Publications ranked by popularity score, then publication date.
Technique for measuring overlay between layers of a multilayer structure
US-2018268539-A1 · Sep 20, 2018 · US
Technique for measuring overlay between layers of a multilayer structure
US-9916652-B2 · Mar 13, 2018 · US
CD-SEM technique for wafers fabrication control
US-9824852-B2 · Nov 21, 2017 · US
Technique for measuring overlay between layers of a multilayer structure
US-2017243343-A1 · Aug 24, 2017 · US
Cd-sem technique for wafers fabrication control
US-2017194125-A1 · Jul 6, 2017 · US
Technique for measuring overlay between layers of a multilayer structure
US-2017018066-A1 · Jan 19, 2017 · US
Technique for measuring overlay between layers of a multilayer structure
US-9530199-B1 · Dec 27, 2016 · US
Recent patents
Latest publications not already listed above.
No data yet.
Major assignees
Companies most often associated with this inventor's publications.
| Assignee | Patents |
|---|---|
| Applied Materials Israel Ltd | 9 |
| Applied Materials Israel Ltd | 1 |
Top CPC classifications
Most common classification codes across this inventor's patents.
| CPC | Patents |
|---|---|
| G06T2207/30148 | 8 |
| G06T2207/10061 | 8 |
| G03F7/70616 | 6 |
| G03F7/11 | 6 |
| G03F1/44 | 6 |