Method and apparatus for predicting yield of semiconductor devices
US-12198061-B2 · Jan 14, 2025 · US
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Chen Hunglin patents
Chen Hunglin is listed as an inventor on 5 patents in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | Chen Hunglin |
| Total patents | 5 |
| First publication | Jan 1, 2015 |
| Latest publication | Jan 14, 2025 |
Notable patents
Publications ranked by popularity score, then publication date.
Method and apparatus for predicting yield of semiconductor devices
US-2022172070-A1 · Jun 2, 2022 · US
Method of detecting and measuring contact alignment shift relative to gate structures in a semicondcutor device
US-9269639-B2 · Feb 23, 2016 · US
Method of inspecting misalignment of polysilicon gate
US-8987013-B2 · Mar 24, 2015 · US
Method of Inspecting Misalignment of Polysilicon Gate
US-2015004723-A1 · Jan 1, 2015 · US
Recent patents
Latest publications not already listed above.
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Major assignees
Companies most often associated with this inventor's publications.
| Assignee | Patents |
|---|---|
| Shanghai Huali Microelect Corp | 3 |
| Shanghai Huali Integrated Circuit Corp | 2 |
Top CPC classifications
Most common classification codes across this inventor's patents.
| CPC | Patents |
|---|---|
| H10P74/27 | 3 |
| H10P74/203 | 3 |
| H10P74/23 | 2 |
| G06N3/0455 | 2 |
| G06N3/09 | 2 |