Charged particle beam device and control method thereof
US-2026058088-A1 · Feb 26, 2026 · US
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Bizen Daisuke patents
Bizen Daisuke is listed as an inventor on 47 patents in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | Bizen Daisuke |
| Total patents | 47 |
| First publication | Feb 12, 2015 |
| Latest publication | Feb 26, 2026 |
Notable patents
Publications ranked by popularity score, then publication date.
Charged particle beam apparatus and method for calculating roughness index
US-12505976-B2 · Dec 23, 2025 · US
Pattern Measurement Method, Measurement System, and Computer-Readable Medium
US-2025327663-A1 · Oct 23, 2025 · US
Charged particle beam device and sample observation method
US-12406826-B2 · Sep 2, 2025 · US
Multipole lens and charged particle beam device
US-2025232944-A1 · Jul 17, 2025 · US
Charged particle beam system and method for determining observation conditions in charged particle beam device
US-12191111-B2 · Jan 7, 2025 · US
Inspection method
US-12181513-B2 · Dec 31, 2024 · US
Charged particle beam device
US-2024363306-A1 · Oct 31, 2024 · US
Sample image observation device and method
US-2024222065-A1 · Jul 4, 2024 · US
Inspection System
US-2024029994-A1 · Jan 25, 2024 · US
Recent patents
Latest publications not already listed above.
Charged particle beam device
US-11869745-B2 · Jan 9, 2024 · US
Inspection Method
US-2023273254-A1 · Aug 31, 2023 · US
Charged particle beam device and sample observation method
US-2023253180-A1 · Aug 10, 2023 · US
Charged particle beam apparatus and method for calculating roughness index
US-2023095456-A1 · Mar 30, 2023 · US
Charged particle beam apparatus and control method
US-11610756-B2 · Mar 21, 2023 · US
Charged particle beam device
US-11456150-B2 · Sep 27, 2022 · US
Charged Particle Beam System and Method For Determining Observation Conditions in Charged Particle Beam Device
US-2022246394-A1 · Aug 4, 2022 · US
Charged particle beam device
US-2022216032-A1 · Jul 7, 2022 · US
Charged particle beam device
US-2022139667-A1 · May 5, 2022 · US
Charged particle beam apparatus and control method
US-2022115203-A1 · Apr 14, 2022 · US
Charged-particle beam apparatus
US-11282671-B2 · Mar 22, 2022 · US
Pattern Measurement Method, Measurement System, and Computer-Readable Medium
US-2021404801-A1 · Dec 30, 2021 · US
Charged particle beam apparatus
US-11211224-B2 · Dec 28, 2021 · US
Pattern cross-sectional shape estimation system and program
US-11211226-B2 · Dec 28, 2021 · US
Scanning electron microscope and calculation method for three-dimensional structure depth
US-11164720-B2 · Nov 2, 2021 · US
Charged Particle Beam Device
US-2021313140-A1 · Oct 7, 2021 · US
Charged particle beam apparatus
US-2021249221-A1 · Aug 12, 2021 · US
Scanning electron microscope and sample observation method using scanning electron microscope
US-11011348-B2 · May 18, 2021 · US
Electron beam device
US-10825649-B2 · Nov 3, 2020 · US
Pattern cross-sectional shape estimation system and program
US-2020321189-A1 · Oct 8, 2020 · US
Major assignees
Companies most often associated with this inventor's publications.
| Assignee | Patents |
|---|---|
| Hitachi High Tech Corp | 39 |
| Hitachi Ltd | 8 |
Top CPC classifications
Most common classification codes across this inventor's patents.
| CPC | Patents |
|---|---|
| H01J37/28 | 46 |
| H01J37/244 | 37 |
| H01J37/222 | 22 |
| H01J2237/2448 | 17 |
| G01N23/2251 | 15 |