Substrate measurement method
US-2026087613-A1 · Mar 26, 2026 · US
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Ahn Jeongho patents
Ahn Jeongho is listed as an inventor on 32 patents in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | Ahn Jeongho |
| Total patents | 32 |
| First publication | Mar 5, 2015 |
| Latest publication | Mar 26, 2026 |
Notable patents
Publications ranked by popularity score, then publication date.
Method for controlling electronic devices and electronic device thereof
US-2026056593-A1 · Feb 26, 2026 · US
Method for controlling electronic devices and electronic device thereof
US-12487653-B2 · Dec 2, 2025 · US
Apparatus and method for inspecting semiconductor device
US-12436106-B2 · Oct 7, 2025 · US
Apparatus and method for measuring electrical conductivity of semiconductor substrate
US-2025306070-A1 · Oct 2, 2025 · US
Defect region detection device and wafer defect detection system including the same
US-2025217960-A1 · Jul 3, 2025 · US
Electronic device comprising motor housing
US-2025147560-A1 · May 8, 2025 · US
Image processing for on-cell overlay measurement
US-2025061560-A1 · Feb 20, 2025 · US
Optical imaging device
US-2025027875-A1 · Jan 23, 2025 · US
Inspection system of semiconductor wafer and method of driving the same
US-12130242-B2 · Oct 29, 2024 · US
Recent patents
Latest publications not already listed above.
Wearable electronic device
US-2024284621-A1 · Aug 22, 2024 · US
Defect inspection device and defect inspection method
US-2024272089-A1 · Aug 15, 2024 · US
Pattern inspection apparatus and pattern inspection method using the same
US-2024192154-A1 · Jun 13, 2024 · US
Substrate inspection apparatus and a method of inspecting a substrate using the same
US-2024151664-A1 · May 9, 2024 · US
Apparatus and method for inspecting semiconductor device
US-2024077424-A1 · Mar 7, 2024 · US
Battery risk evaluation device and operating method thereof
US-2024036118-A1 · Feb 1, 2024 · US
Battery life prediction device and operating method thereof
US-2024036119-A1 · Feb 1, 2024 · US
Inspection system of semiconductor wafer and method of driving the same
US-2023384239-A1 · Nov 30, 2023 · US
Apparatus and method for inspecting and measuring semiconductor device
US-2023332954-A1 · Oct 19, 2023 · US
Inspection system of semiconductor wafer and method of driving the same
US-11754510-B2 · Sep 12, 2023 · US
Method for controlling electronic devices and electronic device thereof
US-2023236649-A1 · Jul 27, 2023 · US
Electronic device for performing wireless communication and wireless communication method
US-11678390-B2 · Jun 13, 2023 · US
Inspection system of semiconductor wafer and method of driving the same
US-2023123710-A1 · Apr 20, 2023 · US
Electronic device for performing wireless communication and wireless communication method
US-2021227603-A1 · Jul 22, 2021 · US
System and method of inspecting substrate and method of fabricating semiconductor device using the same
US-10393672-B2 · Aug 27, 2019 · US
System and method of inspecting substrate and method of fabricating semiconductor device using the same
US-2019033232-A1 · Jan 31, 2019 · US
Method for controlling external electronic device and electronic device for processing same
US-10136286-B2 · Nov 20, 2018 · US
Substrate inspection apparatus
US-10067067-B2 · Sep 4, 2018 · US
Wearable device and method of outputting content thereof
US-9952433-B2 · Apr 24, 2018 · US
Substrate inspection apparatus
US-2017067833-A1 · Mar 9, 2017 · US
Major assignees
Companies most often associated with this inventor's publications.
| Assignee | Patents |
|---|---|
| Samsung Electronics Co Ltd | 31 |
| Lg Electronics Inc | 2 |
| Iac In Nat Univ Chungnam | 2 |
Top CPC classifications
Most common classification codes across this inventor's patents.
| CPC | Patents |
|---|---|
| G01N21/956 | 10 |
| G01N21/8806 | 10 |
| G01N21/9501 | 9 |
| H10P74/203 | 8 |
| H04W4/80 | 7 |