Generating a wafer inspection process using bit failures and virtual inspection
US-10014229-B2 · Jul 3, 2018 · US
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Patent family 48779693
This patent family groups 3 related publications across US. Members often share priority claims or equivalent filings in different countries.
| Field | Value |
|---|---|
| Family ID | 48779693 |
| Family type | — |
| Earliest priority | Jan 18, 2012 |
| First filing country | US |
| Member publications | 3 |
| Countries | US |
| Representative publication | US10014229B2 — Generating a wafer inspection process using bit failures and virtual inspection |
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US10014229B2 — Generating a wafer inspection process using bit failures and virtual inspection (published Jul 3, 2018)
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