Method and apparatus improving gate oxide reliability by controlling accumulated charge
US-10818796-B2 · Oct 27, 2020 · US
This patent family groups 4 related publications across US. Members often share priority claims or equivalent filings in different countries.
| Field | Value |
|---|---|
| Family ID | 37889412 |
| Family type | — |
| Earliest priority | Jul 11, 2005 |
| First filing country | US |
| Member publications | 4 |
| Countries | US |
| Representative publication | US10818796B2 — Method and apparatus improving gate oxide reliability by controlling accumulated charge |
Best representative member for this family based on priority and filing country.
US10818796B2 — Method and apparatus improving gate oxide reliability by controlling accumulated charge (published Oct 27, 2020)
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