Mass analysis apparatus and mass analysis method

Patent metadata

Field	Value
Publication number	US-10763093-B2
Application number	US-201916296673-A
Country	US
Kind code	B2
Filing date	Mar 8, 2019
Priority date	Mar 14, 2018
Publication date	Sep 1, 2020
Grant date	Sep 1, 2020

Abstract

Neutral particles are blocked by a deflector provided upstream of a detector. A controller changes a reference potential V 2 of the deflector in connection with a change of a reference potential V 1 of a collision cell such that a potential difference ΔV between the reference potential V 1 and the reference potential V 2 is constant. The change of the reference potential V 2 is executed during a period in which an ion pulse does not pass the deflector.

First claim

The invention claimed is:

1. A mass analysis apparatus comprising:
a collision cell that generates product ions from precursor ions;
a detector that detects target ions selected from among the product ions;
a deflector that is provided between the collision cell and the detector and that applies a deflection action on the target ions; and
a controller that changes a reference potential of the deflector in connection with a change of a reference potential of the collision cell such that a potential difference between the reference potential of the collision cell and the reference potential of the deflector is constant.

2. The mass analysis apparatus according to claim 1 , wherein
the reference potential of the collision cell is an ion trajectory potential in the collision cell, and
the reference potential of the deflector is an ion trajectory potential in the deflector or an entrance electrode potential in the deflector.

3. The mass analysis apparatus according to claim 1 , wherein
the controller changes the reference potential of the deflector in connection with the change of the reference potential of the collision cell such that a deflection angle of the target ions in the deflector is constant regardless of the change of the reference potential of the collision cell.

4. The mass analysis apparatus according to claim 1 , wherein
the collision cell repeatedly executes an ion storing operation and an ion ejecting operation,
the target ions passes the deflector as an ion pulse, and
the controller changes the reference potential of the deflector in a period other than a period in which the deflection action by an electric field is applied to the target ions in the deflector.

5. The mass analysis apparatus according to claim 1 , wherein
the controller changes the reference potential of the collision cell according to the precursor ions or compounds from which the precursor ions are originated.

6. The mass analysis apparatus according to claim 1 , further comprising:
an ion source that ionizes a sample;
a first mass analyzer that selects the precursor ions from among ions generated by the ion source; and
a second mass analyzer that selects the target ions from among the product ions generated in the collision cell, wherein
the deflector is provided between the second mass analyzer and the detector.

7. A mass analysis method comprising:
generating product ions from precursor ions in a collision cell;
detecting target ions selected from among the product ions in a detector;
applying a deflection action on the target ions in a deflector provided between the collision cell and the detector; and
changing a reference potential of the deflector in connection with a change of a reference potential of the collision cell such that a potential difference between the reference potential of the collision cell and the reference potential of the deflector is constant.

8. A mass analysis apparatus comprising:
an ion source that generates ions;
a collision cell that generates product ions from precursor ions selected from among the ions generated by the ion source;
a detector that detects target ions selected from among the product ions;
a deflector that is provided between the collision cell and the detector and that applies a deflection action on the target ions, wherein the deflector and the detector are positioned to a side of the collision cell opposite the ion source; and
a controller that changes a reference potential of the deflector in connection with a change of a reference potential of the collision cell,
wherein the controller changes the reference potential of the deflector in connection with the change of the reference potential of the collision cell such that a deflection angle of the target ions in the deflector is constant regardless of the change of the reference potential of the collision cell.

9. The mass analysis apparatus according to claim 8 , wherein
the reference potential of the collision cell is an ion trajectory potential in the collision cell, and
the reference potential of the deflector is an ion trajectory potential in the deflector or an entrance electrode potential in the deflector.

10. The mass analysis apparatus according to claim 8 , wherein
the controller changes the reference potential of the deflector in connection with the change of the reference potential of the collision cell such that a potential difference between the reference potential of the collision cell and the reference potential of the deflector is constant.

11. The mass analysis apparatus according to claim 8 , wherein
the collision cell repeatedly executes an ion storing operation and an ion ejecting operation,
the target ions passes the deflector as an ion pulse, and
the controller changes the reference potential of the deflector in a period other than a period in which the deflection action by an electric field is applied to the target ions in the deflector.

12. The mass analysis apparatus according to claim 8 , wherein
the controller changes the reference potential of the collision cell according to the precursor ions or compounds from which the precursor ions are originated.

13. The mass analysis apparatus according to claim 8 , further comprising:
a first mass analyzer that selects the precursor ions from among the ions generated by the ion source; and
a second mass analyzer that selects the target ions from among the product ions generated in the collision cell, wherein
the deflector is provided between the second mass analyzer and the detector.

Assignees

• Jeol Ltd

Inventors

• Kou Junkei

Classifications

• H01J49/0031 Primary

  Step by step routines describing the use of the apparatus (H01J49/0081 takes precedence) · CPC title

• H01J49/22

  Electrostatic deflection · CPC title

• H01J49/426

  Methods for controlling ions · CPC title

• H01J49/061 Primary

  Ion deflecting means, e.g. ion gates · CPC title

• H01J49/0045

  characterised by the fragmentation or other specific reaction · CPC title