Scanning ion beam deposition and etch
US-12176178-B2 · Dec 24, 2024 · US
Beam current control or regulation circuits (H01J37/241 takes precedence)
Beam current control or regulation circuits (H01J37/241 takes precedence) · Cooperative Patent Classification (CPC)
Electric circuits, power, telecommunications, and semiconductors.
Related technology areas
Mapped technology topics for this CPC code.
| Metric | Value |
|---|---|
| CPC code | H01J37/243 |
| Official title | {Beam current control or regulation circuits (H01J37/241 takes precedence)} |
| Display label | Beam current control or regulation circuits (H01J37/241 takes precedence) |
| Total patents | 145 |
Filing trend
Year-over-year patent counts classified under this CPC code.
Filing activity over the last five years is growing.
| Year | Patents |
|---|---|
| 2015 | 13 |
| 2016 | 12 |
| 2017 | 10 |
| 2018 | 14 |
| 2019 | 14 |
| 2020 | 15 |
| 2021 | 11 |
| 2022 | 13 |
| 2023 | 17 |
| 2024 | 10 |
| 2025 | 14 |
| 2026 | 2 |
Representative patents
Representative publications under this CPC code from precomputed stats, or recent filings when stats are unavailable.
Electron energy loss spectroscopy with adjustable energy resolution
US-10522323-B2 · Dec 31, 2019 · US
Method for operating a particle beam generator for a particle beam device and particle beam device comprising a particle beam generator
US-2019355551-A1 · Nov 21, 2019 · US
Charged particle beam writing method and charged particle beam writing apparatus
US-10460909-B2 · Oct 29, 2019 · US
Emission noise correction of a charged particle source
US-10453647-B2 · Oct 22, 2019 · US
Electron energy loss spectroscopy with adjustable energy resolution
US-2019311880-A1 · Oct 10, 2019 · US
Ion implantation apparatus and ion implantation method
US-10381192-B2 · Aug 13, 2019 · US
System And Method To Monitor Glitch Energy
US-2019189390-A1 · Jun 20, 2019 · US
Electronic beam machining system
US-10319563-B2 · Jun 11, 2019 · US
Electron beam detection element, electron microscope, and transmission electron microscope
US-2019139749-A1 · May 9, 2019 · US
Ion implantation apparatus and ion implantation method
US-2019074158-A1 · Mar 7, 2019 · US
Method and system for adjusting focal point position
US-2018358198-A1 · Dec 13, 2018 · US
Semiconductor plasma antenna apparatus
US-10147583-B2 · Dec 4, 2018 · US
Multi charged particle beam writing apparatus, and multi charged particle beam writing method
US-10134562-B2 · Nov 20, 2018 · US
X-ray system and method of inspecting x-ray tube
US-2018315579-A1 · Nov 1, 2018 · US
Control system and method for lithography apparatus
US-10096450-B2 · Oct 9, 2018 · US
Charged particle beam writing method and charged particle beam writing apparatus
US-2018269034-A1 · Sep 20, 2018 · US
Multi charged particle beam writing method and multi charged particle beam writing apparatus
US-2018261421-A1 · Sep 13, 2018 · US
Electron beam drawing apparatus and electron beam drawing method
US-10074507-B2 · Sep 11, 2018 · US
Emission noise correction of a charged particle source
US-2018233322-A1 · Aug 16, 2018 · US
Frequently asked questions
Answers are generated from the same data shown on this page.
- What is CPC H01J37/243?
- CPC H01J37/243 is the Cooperative Patent Classification code for “Beam current control or regulation circuits (H01J37/241 takes precedence).”
- How many patents are filed under CPC H01J37/243 (Beam current control or regulation circuits (H01J37/241 takes precedence))?
- Our database includes 145 publications tagged with this CPC code.
- Is patent activity under CPC H01J37/243 growing?
- Publication counts under this code: 10 in 2024 vs 14 in 2025 (latest complete years).