Methods, mediums, and systems for identifying tunable domains for ion beam shape matching
US-12340967-B2 · Jun 24, 2025 · US
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Arrangements for controlling cross-section of ray or beam; Arrangements for correcting aberration of beam, e.g. due to lenses (H01J3/02, H01J3/04 take precedence)
Arrangements for controlling cross-section of ray or beam; Arrangements for correcting aberration of beam, e.g. due to lenses (H01J3/02, H01J3/04 take precedence) · Cooperative Patent Classification (CPC)
Electric circuits, power, telecommunications, and semiconductors.
Related technology areas
Mapped technology topics for this CPC code.
| Metric | Value |
|---|---|
| CPC code | H01J3/12 |
| Official title | Arrangements for controlling cross-section of ray or beam; Arrangements for correcting aberration of beam, e.g. due to lenses (H01J3/02, H01J3/04 take precedence) |
| Display label | Arrangements for controlling cross-section of ray or beam; Arrangements for correcting aberration of beam, e.g. due to lenses (H01J3/02, H01J3/04 take precedence) |
| Total patents | 14 |
Filing trend
Year-over-year patent counts classified under this CPC code.
Filing activity over the last five years is declining.
| Year | Patents |
|---|---|
| 2015 | 3 |
| 2016 | 3 |
| 2017 | 2 |
| 2019 | 2 |
| 2021 | 1 |
| 2022 | 1 |
| 2023 | 1 |
| 2025 | 1 |
Representative patents
Representative publications under this CPC code from precomputed stats, or recent filings when stats are unavailable.
Methods, mediums, and systems for identifying tunable domains for ion beam shape matching
US-2023013095-A1 · Jan 19, 2023 · US
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Variable-focus magnetostatic lens
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Space Charge Insensitive Electron Gun Designs
US-2019371564-A1 · Dec 5, 2019 · US
Electron gun, control method and control program thereof, and three-dimensional shaping apparatus
US-10217599-B2 · Feb 26, 2019 · US
Device and method for optimizing diffusion section of electron beam
US-9767985-B2 · Sep 19, 2017 · US
Charged particle-beam device
US-9653256-B2 · May 16, 2017 · US
Charged-Particle-Beam Device
US-2016300690-A1 · Oct 13, 2016 · US
Device and method for optimizing diffusion section of electron beam
US-2016189914-A1 · Jun 30, 2016 · US
Spherical aberration corrector, method of spherical aberration correction, and charged particle beam instrument
US-9256068-B2 · Feb 9, 2016 · US
Method for correcting electronic proximity effects using off-center scattering functions
US-9224577-B2 · Dec 29, 2015 · US
Charged particle lithography system with a long shape illumination beam
US-9202662-B2 · Dec 1, 2015 · US
Spherical Aberration Corrector, Method of Spherical Aberration Correction, and Charged Particle Beam Instrument
US-2015029593-A1 · Jan 29, 2015 · US