Semiconductor inspection device
US-11209476-B2 · Dec 28, 2021 · US
Contactless testing {(G01R31/66 takes precedence)}
Contactless testing {(G01R31/66 takes precedence)} · Cooperative Patent Classification (CPC)
Computing, optics, measurement, and control technologies.
Related technology areas
Mapped technology topics for this CPC code.
| Metric | Value |
|---|---|
| CPC code | G01R31/302 |
| Official title | Contactless testing {(G01R31/66 takes precedence)} |
| Display label | Contactless testing {(G01R31/66 takes precedence)} |
| Total patents | 100 |
Filing trend
Year-over-year patent counts classified under this CPC code.
Filing activity over the last five years is rapidly declining.
| Year | Patents |
|---|---|
| 2015 | 4 |
| 2016 | 9 |
| 2017 | 5 |
| 2018 | 6 |
| 2019 | 10 |
| 2020 | 16 |
| 2021 | 15 |
| 2022 | 8 |
| 2023 | 12 |
| 2024 | 7 |
| 2025 | 6 |
| 2026 | 2 |
Representative patents
Representative publications under this CPC code from precomputed stats, or recent filings when stats are unavailable.
Non-contact DC voltage measurement device with oscillating sensor
US-11209480-B2 · Dec 28, 2021 · US
Semiconductor sample inspection device and inspection method
US-2021325435-A1 · Oct 21, 2021 · US
Contactless testing of electronic circuits
US-11137417-B2 · Oct 5, 2021 · US
Electromagnetic field probe
US-11092635-B2 · Aug 17, 2021 · US
Optical systems and methods of characterizing high-k dielectrics
US-10989664-B2 · Apr 27, 2021 · US
Semiconductor device inspection method and semiconductor device inspection device
US-10983162-B2 · Apr 20, 2021 · US
Inspection device and inspection method
US-10976284-B2 · Apr 13, 2021 · US
Semiconductor device inspection apparatus and semiconductor device inspection method
US-10955458-B2 · Mar 23, 2021 · US
Optical difference detector and inspection device
US-2021010856-A1 · Jan 14, 2021 · US
Non-contact dc voltage measurement device with oscillating sensor
US-2020408836-A1 · Dec 31, 2020 · US
Contactless testing of electronic circuits
US-2020348340-A1 · Nov 5, 2020 · US
Non-contact DC voltage measurement device with oscillating sensor
US-10802072-B2 · Oct 13, 2020 · US
Delivery of light into a vacuum chamber using an optical fiber
US-2020266116-A1 · Aug 20, 2020 · US
Anechoic chamber and signal test system containing the same
US-10746762-B2 · Aug 18, 2020 · US
Probe card
US-10705122-B2 · Jul 7, 2020 · US
Detecting die repeating programmed defects located in backgrounds with non-repeating features
US-10677742-B2 · Jun 9, 2020 · US
Non-destructive inspection system for detecting defects in compound semiconductor wafer and method of operating the same
US-2020150060-A1 · May 14, 2020 · US
Inspection device and inspection method
US-2020132629-A1 · Apr 30, 2020 · US
Anechoic Chamber and Signal Test System Containing the Same
US-2020132719-A1 · Apr 30, 2020 · US
Frequently asked questions
Answers are generated from the same data shown on this page.
- What is CPC G01R31/302?
- CPC G01R31/302 is the Cooperative Patent Classification code for “Contactless testing {(G01R31/66 takes precedence)}.”
- How many patents are filed under CPC G01R31/302 (Contactless testing {(G01R31/66 takes precedence)})?
- Our database includes 100 publications tagged with this CPC code.
- Is patent activity under CPC G01R31/302 growing?
- Publication counts under this code: 7 in 2024 vs 6 in 2025 (latest complete years).