Limiting circuitry with controlled parallel direct current-direct current-converters
US-12332302-B2 · Jun 17, 2025 · US
External aspects, e.g. related to chambers, contacting devices or handlers
External aspects, e.g. related to chambers, contacting devices or handlers · Cooperative Patent Classification (CPC)
Computing, optics, measurement, and control technologies.
Related technology areas
Mapped technology topics for this CPC code.
| Metric | Value |
|---|---|
| CPC code | G01R31/286 |
| Official title | {External aspects, e.g. related to chambers, contacting devices or handlers} |
| Display label | External aspects, e.g. related to chambers, contacting devices or handlers |
| Total patents | 28 |
Filing trend
Year-over-year patent counts classified under this CPC code.
Filing activity over the last five years is rapidly declining.
| Year | Patents |
|---|---|
| 2015 | 3 |
| 2016 | 1 |
| 2017 | 1 |
| 2018 | 3 |
| 2019 | 1 |
| 2020 | 5 |
| 2021 | 5 |
| 2022 | 4 |
| 2023 | 2 |
| 2024 | 2 |
| 2025 | 1 |
Representative patents
Representative publications under this CPC code from precomputed stats, or recent filings when stats are unavailable.
Margin test data tagging and predictive expected margins
US-12061232-B2 · Aug 13, 2024 · US
Conductive perforated plate for electrical test
US-2024142496-A1 · May 2, 2024 · US
Limiting circuitry with controlled parallel direct current-direct current-converters
US-2023341461-A1 · Oct 26, 2023 · US
Inspection apparatus and inspection method
US-2023314362-A1 · Oct 5, 2023 · US
Systems and methods for depopulating pins from contactor test sockets for packaged semiconductor devices
US-11493535-B2 · Nov 8, 2022 · US
Substrate inspection device and substrate inspection method
US-11454670-B2 · Sep 27, 2022 · US
Integrated circuit, crack status detector and crack status detection method
US-11300610-B1 · Apr 12, 2022 · US
Margin test data tagging and predictive expected margins
US-2022091185-A1 · Mar 24, 2022 · US
Substrate inspection device and substrate inspection method
US-2021278455-A1 · Sep 9, 2021 · US
Method and apparatus for controlling tester, medium and electronic device
US-11112450-B2 · Sep 7, 2021 · US
Low power mode testing in an integrated circuit
US-11047904-B2 · Jun 29, 2021 · US
Method and apparatus for controlling tester, medium and electronic device
US-2021156905-A1 · May 27, 2021 · US
Test apparatus
US-10983164-B2 · Apr 20, 2021 · US
Low power mode testing in an integrated circuit
US-2020284830-A1 · Sep 10, 2020 · US
Systems and Methods for Depopulating Pins from Contactor Test Sockets for Packaged Semiconductor Devices
US-2020141974-A1 · May 7, 2020 · US
Test apparatus
US-2020132765-A1 · Apr 30, 2020 · US
Test apparatus
US-10557888-B2 · Feb 11, 2020 · US
Systems and methods for depopulating pins from contactor test sockets for packaged semiconductor devices
US-10539592-B2 · Jan 21, 2020 · US
Lifting system, method for electrical testing, vibration damper, and machine assembly
US-10355622-B2 · Jul 16, 2019 · US
Frequently asked questions
Answers are generated from the same data shown on this page.
- What is CPC G01R31/286?
- CPC G01R31/286 is the Cooperative Patent Classification code for “External aspects, e.g. related to chambers, contacting devices or handlers.”
- How many patents are filed under CPC G01R31/286 (External aspects, e.g. related to chambers, contacting devices or handlers)?
- Our database includes 28 publications tagged with this CPC code.
- Is patent activity under CPC G01R31/286 growing?
- Publication counts under this code: 2 in 2024 vs 1 in 2025 (latest complete years).