Method for producing a substrate comprising multiple tips for scanning probe microscopy
US-12584943-B2 · Mar 24, 2026 · US
Probe characteristics
Probe characteristics · Cooperative Patent Classification (CPC)
Computing, optics, measurement, and control technologies.
Related technology areas
Mapped technology topics for this CPC code.
| Metric | Value |
|---|---|
| CPC code | G01Q70/08 |
| Official title | Probe characteristics |
| Display label | Probe characteristics |
| Total patents | 51 |
Filing trend
Year-over-year patent counts classified under this CPC code.
Filing activity over the last five years is stable.
| Year | Patents |
|---|---|
| 2015 | 5 |
| 2016 | 4 |
| 2017 | 4 |
| 2018 | 3 |
| 2019 | 4 |
| 2020 | 4 |
| 2021 | 2 |
| 2022 | 11 |
| 2023 | 3 |
| 2024 | 8 |
| 2025 | 2 |
| 2026 | 1 |
Representative patents
Representative publications under this CPC code from precomputed stats, or recent filings when stats are unavailable.
Method of inspecting tip of atomic force microscope and method of manufacturing semiconductor device
US-2025341540-A1 · Nov 6, 2025 · US
Method of inspecting tip of atomic force microscope and method of manufacturing semiconductor device
US-12385946-B2 · Aug 12, 2025 · US
Scanning probe microscope
US-2024426870-A1 · Dec 26, 2024 · US
Methods and devices for extending a time period until changing a measuring tip of a scanning probe microscope
US-2024272198-A1 · Aug 15, 2024 · US
Tip-enhanced spectroscopy
US-2024230520-A1 · Jul 11, 2024 · US
System and method for a non-tapping mode scattering-type scanning near-field optical microscopy
US-12000861-B2 · Jun 4, 2024 · US
Method for Producing a Substrate Comprising Multiple Tips for Scanning Probe Microscopy
US-2024175896-A1 · May 30, 2024 · US
Methods and devices for extending a time period until changing a measuring tip of a scanning probe microscope
US-11977097-B2 · May 7, 2024 · US
Coated active cantilever probes for use in topography imaging in opaque liquid environments, and methods of performing topography imaging
US-11906546-B2 · Feb 20, 2024 · US
Probe for scanning probe microscope and binary state scanning probe microscope including the same
US-11860188-B2 · Jan 2, 2024 · US
Apparatus and method for a scanning probe microscope
US-11796563-B2 · Oct 24, 2023 · US
Method of inspecting tip of atomic force microscope and method of manufacturing semiconductor device
US-2023194567-A1 · Jun 22, 2023 · US
Method and apparatus for examining a measuring tip of a scanning probe microscope
US-11680963-B2 · Jun 20, 2023 · US
System and Method for a Non-Tapping Mode Scattering-Type Scanning Near-Field Optical Microscopy
US-2022390485-A1 · Dec 8, 2022 · US
Modular scanning probe microscope head
US-11474127-B2 · Oct 18, 2022 · US
Probe for Scanning Probe Microscope and Binary State Scanning Probe Microscope Including the Same
US-2022308086-A1 · Sep 29, 2022 · US
Methods and devices for extending a time period until changing a measuring tip of a scanning probe microscope
US-2022291255-A1 · Sep 15, 2022 · US
System and method for a non-tapping mode scattering-type scanning near-field optical microscopy
US-11415597-B2 · Aug 16, 2022 · US
Coated active cantilever probes for use in topography imaging in opaque liquid environments, and methods of performing topography imaging
US-2022244288-A1 · Aug 4, 2022 · US
Frequently asked questions
Answers are generated from the same data shown on this page.
- What is CPC G01Q70/08?
- CPC G01Q70/08 is the Cooperative Patent Classification code for “Probe characteristics.”
- How many patents are filed under CPC G01Q70/08 (Probe characteristics)?
- Our database includes 51 publications tagged with this CPC code.
- Is patent activity under CPC G01Q70/08 growing?
- Publication counts under this code: 8 in 2024 vs 2 in 2025 (latest complete years).