SNOM [Scanning Near-field Optical Microscopy] combined with AFM [Atomic Force Microscopy]

SNOM [Scanning Near-field Optical Microscopy] combined with AFM [Atomic Force Microscopy] · Cooperative Patent Classification (CPC)

Computing, optics, measurement, and control technologies.

Related technology areas

Mapped technology topics for this CPC code.

CPC classification statistics
MetricValue
CPC codeG01Q60/06
Official titleSNOM [Scanning Near-field Optical Microscopy] combined with AFM [Atomic Force Microscopy]
Display labelSNOM [Scanning Near-field Optical Microscopy] combined with AFM [Atomic Force Microscopy]
Total patents34

Filing trend

Year-over-year patent counts classified under this CPC code.

Filing activity over the last five years is declining.

Patents filed per year
YearPatents
20153
20162
20172
20183
20193
20204
20216
20223
20231
20244
20253

Representative patents

Representative publications under this CPC code from precomputed stats, or recent filings when stats are unavailable.

Frequently asked questions

Answers are generated from the same data shown on this page.

What is CPC G01Q60/06?
CPC G01Q60/06 is the Cooperative Patent Classification code for “SNOM [Scanning Near-field Optical Microscopy] combined with AFM [Atomic Force Microscopy].”
How many patents are filed under CPC G01Q60/06 (SNOM [Scanning Near-field Optical Microscopy] combined with AFM [Atomic Force Microscopy])?
Our database includes 34 publications tagged with this CPC code.
Is patent activity under CPC G01Q60/06 growing?
Publication counts under this code: 4 in 2024 vs 3 in 2025 (latest complete years).