Cantilever with a collocated piezoelectric actuator-sensor pair
US-11852654-B2 · Dec 26, 2023 · US
Self-actuating probes, i.e. wherein the actuating means for driving are part of the probe itself, e.g. piezoelectric means on a cantilever probe
Self-actuating probes, i.e. wherein the actuating means for driving are part of the probe itself, e.g. piezoelectric means on a cantilever probe · Cooperative Patent Classification (CPC)
Computing, optics, measurement, and control technologies.
Related technology areas
Mapped technology topics for this CPC code.
| Metric | Value |
|---|---|
| CPC code | G01Q10/045 |
| Official title | {Self-actuating probes, i.e. wherein the actuating means for driving are part of the probe itself, e.g. piezoelectric means on a cantilever probe} |
| Display label | Self-actuating probes, i.e. wherein the actuating means for driving are part of the probe itself, e.g. piezoelectric means on a cantilever probe |
| Total patents | 74 |
Filing trend
Year-over-year patent counts classified under this CPC code.
Filing activity over the last five years is declining.
| Year | Patents |
|---|---|
| 2015 | 4 |
| 2016 | 3 |
| 2017 | 8 |
| 2018 | 5 |
| 2019 | 8 |
| 2020 | 11 |
| 2021 | 8 |
| 2022 | 7 |
| 2023 | 7 |
| 2024 | 6 |
| 2025 | 6 |
| 2026 | 1 |
Representative patents
Representative publications under this CPC code from precomputed stats, or recent filings when stats are unavailable.
Apparatus and method for a scanning probe microscope
US-11796563-B2 · Oct 24, 2023 · US
Manufacturing method of a strain gauge sensor
US-2023292620-A1 · Sep 14, 2023 · US
Cantilever, scanning probe microscope, and measurement method using scanning probe microscope
US-11733264-B2 · Aug 22, 2023 · US
AFM imaging with creep correction
US-11714104-B2 · Aug 1, 2023 · US
Thermally stable, drift resistant probe for a scanning probe microscope and method of manufacture
US-11644480-B2 · May 9, 2023 · US
AFM Imaging with Creep Correction
US-2022381803-A1 · Dec 1, 2022 · US
Method and metrology tool for determining information about a target structure, and cantilever probe
US-2022283122-A1 · Sep 8, 2022 · US
Cantilever, scanning probe microscope, and measurement method using scanning probe microscope
US-2022260611-A1 · Aug 18, 2022 · US
Coated active cantilever probes for use in topography imaging in opaque liquid environments, and methods of performing topography imaging
US-2022244288-A1 · Aug 4, 2022 · US
Apparatus and method for a scanning probe microscope
US-2022146548-A1 · May 12, 2022 · US
Scanning probe microscope, scan head and method
US-2022057430-A1 · Feb 24, 2022 · US
Apparatus and method for a scanning probe microscope
US-11237185-B2 · Feb 1, 2022 · US
Method and device of using a scanning probe microscope
US-11112426-B2 · Sep 7, 2021 · US
Scanning probe microscope and method for increasing a scan speed of a scanning probe microscope in the step-in scan mode
US-11054439-B2 · Jul 6, 2021 · US
Method for producing a probe suitable for scanning probe microscopy
US-11035880-B2 · Jun 15, 2021 · US
Surface analyzer
US-10996238-B2 · May 4, 2021 · US
Micro-optomechanical system and method for the production thereof
US-2021096152-A1 · Apr 1, 2021 · US
Cantilever with a collocated piezoelectric actuator-sensor pair
US-2021020825-A1 · Jan 21, 2021 · US
Nozzle inspection method and apparatus
US-10890427-B2 · Jan 12, 2021 · US
Frequently asked questions
Answers are generated from the same data shown on this page.
- What is CPC G01Q10/045?
- CPC G01Q10/045 is the Cooperative Patent Classification code for “Self-actuating probes, i.e. wherein the actuating means for driving are part of the probe itself, e.g. piezoelectric means on a cantilever probe.”
- How many patents are filed under CPC G01Q10/045 (Self-actuating probes, i.e. wherein the actuating means for driving are part of the probe itself, e.g. piezoelectric means on a cantilever probe)?
- Our database includes 74 publications tagged with this CPC code.
- Is patent activity under CPC G01Q10/045 growing?
- Publication counts under this code: 6 in 2024 vs 6 in 2025 (latest complete years).