Nano-indentation test to determine mechanical properties of reservoir rock
US-2017370895-A1 · Dec 28, 2017 · US
by performing impressions under a steady load by indentors, e.g. sphere, pyramid (G01N3/54 takes precedence)
by performing impressions under a steady load by indentors, e.g. sphere, pyramid (G01N3/54 takes precedence) · Cooperative Patent Classification (CPC)
Computing, optics, measurement, and control technologies.
Related technology areas
Mapped technology topics for this CPC code.
| Metric | Value |
|---|---|
| CPC code | G01N3/42 |
| Official title | by performing impressions under a steady load by indentors, e.g. sphere, pyramid (G01N3/54 takes precedence) |
| Display label | by performing impressions under a steady load by indentors, e.g. sphere, pyramid (G01N3/54 takes precedence) |
| Total patents | 297 |
Filing trend
Year-over-year patent counts classified under this CPC code.
Filing activity over the last five years is stable.
| Year | Patents |
|---|---|
| 2015 | 23 |
| 2016 | 18 |
| 2017 | 19 |
| 2018 | 26 |
| 2019 | 33 |
| 2020 | 29 |
| 2021 | 34 |
| 2022 | 29 |
| 2023 | 30 |
| 2024 | 20 |
| 2025 | 31 |
| 2026 | 5 |
Representative patents
Representative publications under this CPC code from precomputed stats, or recent filings when stats are unavailable.
Loadcell probe for overload protection
US-9797820-B2 · Oct 24, 2017 · US
Low-friction sealing device and rolling bearing equipped therewith
US-2017284470-A1 · Oct 5, 2017 · US
Hot testing machine, in particular of thermoplastic polymers, and associated method
US-2017284916-A1 · Oct 5, 2017 · US
Predicting semiconductor package warpage
US-2017284913-A1 · Oct 5, 2017 · US
Machine for testing thermal resistance of plastic materials, in particular thermoplastic polymers
US-2017284950-A1 · Oct 5, 2017 · US
Predicting semiconductor package warpage
US-9772268-B2 · Sep 26, 2017 · US
Determination of young'S modulus of porous thin films using ultra-low load nano-indentation
US-9766170-B2 · Sep 19, 2017 · US
Method for evaluating semiconductor wafer and apparatus for evaluating semiconductor wafer
US-9746400-B2 · Aug 29, 2017 · US
Hardness testing apparatus and hardness testing method
US-2017122856-A1 · May 4, 2017 · US
Method for testing of flexural fatigue resistance and associated system thereof
US-2017108420-A1 · Apr 20, 2017 · US
System and method for assessment of a workpiece in a continuous flow process
US-2017108855-A1 · Apr 20, 2017 · US
Hardness testing apparatus and indenter of hardness testing apparatus
US-2017102305-A1 · Apr 13, 2017 · US
Glass sheet
US-9604876-B2 · Mar 28, 2017 · US
Method for determining geomechanical parameters of a rock sample
US-9606036-B2 · Mar 28, 2017 · US
Hardness test apparatus and hardness testing method
US-2017074765-A1 · Mar 16, 2017 · US
Hardness tester
US-2017074763-A1 · Mar 16, 2017 · US
Hardness test apparatus and hardness testing method
US-2017074764-A1 · Mar 16, 2017 · US
Method for determining mechanical properties of a material
US-2017030814-A1 · Feb 2, 2017 · US
Apparatuses and methods for determining performance parameters of a flexible surface
US-2016356676-A1 · Dec 8, 2016 · US
Frequently asked questions
Answers are generated from the same data shown on this page.
- What is CPC G01N3/42?
- CPC G01N3/42 is the Cooperative Patent Classification code for “by performing impressions under a steady load by indentors, e.g. sphere, pyramid (G01N3/54 takes precedence).”
- How many patents are filed under CPC G01N3/42 (by performing impressions under a steady load by indentors, e.g. sphere, pyramid (G01N3/54 takes precedence))?
- Our database includes 297 publications tagged with this CPC code.
- Is patent activity under CPC G01N3/42 growing?
- Publication counts under this code: 20 in 2024 vs 31 in 2025 (latest complete years).