Method for classifying unknown particles on a surface of a semi-conductor wafer
US-12596062-B2 · Apr 7, 2026 · US
standards (constitution)
standards (constitution) · Cooperative Patent Classification (CPC)
Computing, optics, measurement, and control technologies.
Related technology areas
Mapped technology topics for this CPC code.
| Metric | Value |
|---|---|
| CPC code | G01N2223/3037 |
| Official title | standards (constitution) |
| Display label | standards (constitution) |
| Total patents | 44 |
Filing trend
Year-over-year patent counts classified under this CPC code.
Filing activity over the last five years is growing.
| Year | Patents |
|---|---|
| 2015 | 2 |
| 2016 | 4 |
| 2017 | 4 |
| 2018 | 2 |
| 2019 | 1 |
| 2020 | 5 |
| 2021 | 3 |
| 2022 | 5 |
| 2023 | 7 |
| 2024 | 5 |
| 2025 | 5 |
| 2026 | 1 |
Representative patents
Representative publications under this CPC code from precomputed stats, or recent filings when stats are unavailable.
Method for manufacturing reference piece for x-ray measurement of residual stress and reference piece for x-ray measurement of residual stress
US-12480894-B2 · Nov 25, 2025 · US
Correction amount specifying apparatus, method, program, and jig
US-12287301-B2 · Apr 29, 2025 · US
Eds calibration
US-2025110070-A1 · Apr 3, 2025 · US
Mass estimation method and x-ray inspection apparatus
US-2025085239-A1 · Mar 13, 2025 · US
Calibration component for a turbomachine having representative quality indicators
US-12246380-B2 · Mar 11, 2025 · US
Apparatus for fully automated x-ray tomography system performance validation according to standards for metrology and image quality testing
US-2024328965-A1 · Oct 3, 2024 · US
Target for calibrating and determining the spatial resolution, SNR and/or CNR associated with an XCT system
US-2024159693-A1 · May 16, 2024 · US
Ore component analysis device and method
US-11953455-B1 · Apr 9, 2024 · US
System and method for crack detection
US-11946883-B1 · Apr 2, 2024 · US
Calibration component for a turbomachine having representative quality indicators
US-2024003263-A1 · Jan 4, 2024 · US
Method for classifying unknown particles on a surface of a semi-conductor wafer
US-2023417644-A1 · Dec 28, 2023 · US
Glass composition and method for producing glass composition
US-2023365455-A1 · Nov 16, 2023 · US
Quantitative analysis method, quantitative analysis program, and X-ray fluorescence spectrometer
US-11782000-B2 · Oct 10, 2023 · US
Apparatus for inspecting semiconductor device and method for inspecting semiconductor device
US-11703465-B2 · Jul 18, 2023 · US
Method for manufacturing reference piece for x-ray measurement of residual stress and reference piece for x-ray measurement of residual stress
US-2023160843-A1 · May 25, 2023 · US
Correction amount specifying apparatus, method, program, and jig
US-2023152248-A1 · May 18, 2023 · US
Quantitative analysis method, quantitative analysis program, and x-ray fluorescence spectrometer
US-2023060446-A1 · Mar 2, 2023 · US
X-ray fluorescence spectrometer
US-11513086-B2 · Nov 29, 2022 · US
X-ray fluorescence spectrometer
US-2022260506-A1 · Aug 18, 2022 · US
Frequently asked questions
Answers are generated from the same data shown on this page.
- What is CPC G01N2223/3037?
- CPC G01N2223/3037 is the Cooperative Patent Classification code for “standards (constitution).”
- How many patents are filed under CPC G01N2223/3037 (standards (constitution))?
- Our database includes 44 publications tagged with this CPC code.
- Is patent activity under CPC G01N2223/3037 growing?
- Publication counts under this code: 5 in 2024 vs 5 in 2025 (latest complete years).