X-ray fluorescence spectrometer

Patent metadata

Field	Value
Publication number	US-11513086-B2
Application number	US-202217733626-A
Country	US
Kind code	B2
Filing date	Apr 29, 2022
Priority date	May 18, 2020
Publication date	Nov 29, 2022
Grant date	Nov 29, 2022

Abstract

A sequential X-ray fluorescence spectrometer according to the present invention includes a total analysis time display unit configured to measure, for each kind of analytical sample, a standard sample which contains a component at a known content as a standard value to determine a measured intensity of each measurement line corresponding to the component. The total analysis time display unit is further configured to calculate, for each component, a counting time which gives a specified analytical precision by using the standard value and the measured intensity and to calculate a total counting time as a sum of the counting times of respective components. The total analysis time display unit is configured to calculate a total analysis time as a sum of the total counting time and a total non-counting time and to output the calculated total analysis time and the calculated counting times of the respective components.

First claim

What is claimed is:

1. A sequential X-ray fluorescence spectrometer configured to irradiate a sample placed at a measurement position with primary X-rays and to determine a content of a component in the sample on the basis of a measured intensity of fluorescent X-rays generated,
wherein a sample transfer time represents, in a case of continuous measurement of a plurality of samples, a time required for replacement of one sample at the measurement position and, in a case of measurement of only one sample, a time required for introduction of that sample to the measurement position from outside of the sequential X-ray fluorescence spectrometer and removal of that sample from the measurement position to the outside of the sequential X-ray fluorescence spectrometer,
a total measurement condition change time represents a total time required for changing a measurement condition so as to correspond to each measurement line, which represents fluorescent X-rays having an intensity to be measured, for a sample placed at the measurement position,
a total counting time represents a sum of counting times of respective measurement lines for a sample placed at the measurement position,
a total non-counting time represents a sum of the sample transfer time and the total measurement condition change time,
a total analysis time represents a sum of the total counting time and the total non-counting time,
the sequential X-ray fluorescence spectrometer comprises a total analysis time display unit configured to output the total analysis time to a display module,
the total analysis time display unit is configured:
to measure, for each kind of analytical sample, a standard sample which contains a component at a known content as a standard value to determine a measured intensity of each measurement line corresponding to the component,
to calculate, for each component, a counting time which gives a specified analytical precision by using the standard value and the measured intensity and to calculate the total counting time as a sum of the counting times of respective components, and
to calculate the total analysis time as a sum of the total counting time and the total non-counting time and to output the calculated total analysis time and the calculated counting times of the respective components.

2. The sequential X-ray fluorescence spectrometer as claimed in claim 1 , wherein for an arbitrary sample containing a plurality of components, the sample transfer time and the total measurement condition change time are measured, and an average measurement condition change time per component is calculated, and
the total analysis time display unit is configured to store the measured sample transfer time and the calculated average measurement condition change time per component and to calculate the total non-counting time on the basis of the stored sample transfer time and the stored average measurement condition change time per component, as well as the number of components of the analytical sample.

3. The sequential X-ray fluorescence spectrometer as claimed in claim 1 , wherein for each kind of sample, an arbitrary sample is measured with a provisional counting time set for each component, and the total analysis time is measured, in the case of continuous measurement of a plurality of samples, as a time from placement of one sample at the measurement position to placement of a next sample at the measurement position and, in the case of measurement of only one sample, as a time from introduction of that sample from outside of the sequential X-ray fluorescence spectrometer to removal of that sample to the outside of the sequential X-ray fluorescence spectrometer; the total non-counting time is calculated by subtracting the total counting time which is a sum of the provisional counting times of the respective components from the measured total analysis time, and
the total analysis time display unit is configured to store the calculated total non-counting time.

4. A sequential X-ray fluorescence spectrometer configured to irradiate a sample placed at a measurement position with primary X-rays and to determine a content of a component in the sample on the basis of a measured intensity of fluorescent X-rays generated,
wherein a sample transfer time represents, in a case of continuous measurement of a plurality of samples, a time required for replacement of one sample at the measurement position and, in a case of measurement of only one sample, a time required for introduction of that sample to the measurement position from outside of the sequential X-ray fluorescence spectrometer and removal of that sample from the measurement position to the outside of the sequential X-ray fluorescence spectrometer,
a total measurement condition change time represents a total time required for changing a measurement condition so as to correspond to each measurement line, which represents fluorescent X-rays having an intensity to be measured, for a sample placed at the measurement position,
a total counting time represents a sum of counting times of respective measurement lines for a sample placed at the measurement position,
a total non-counting time represents a sum of the sample transfer time and the total measurement condition change time,
a total analysis time represents a sum of the total counting time and the total non-counting time,
the sequential X-ray fluorescence spectrometer comprises a total analysis time display unit configured to output the total analysis time to a display module,
the total analysis time display unit is configured:
to measure, for each kind of analytical sample, a standard sample which contains a component at a known content as a standard value to determine a measured intensity of each measurement line corresponding to the component,
to calculate, for each component, an analytical precision which is obtained with a specified counting time by using the standard value and the measured intensity and to calculate the total counting time as a sum of the specified counting times of respective components, and
to calculate the total analysis time as a sum of the total counting time and the total non-counting time and to output the calculated total analysis time and the calculated analytical precisions of the respective components.

5. The sequential X-ray fluorescence spectrometer as claimed in claim 4 , wherein for an arbitrary sample containing a plurality of components, the sample transfer time and the total measurement condition change time are measured, and an average measurement condition change time per component is calculated, and
the total analysis time display unit is configured to store the measured sample transfer time and the calculated average measurement condition change time per component and to calculate the total non-counting time on the basis of the stored sample transfer time and the stored average measurement condition change time per component, as well as the number of components of the analytical sample.

6. The sequential X-ray fluorescence spectrometer as claimed in claim 4 , wherein for each kind of sample, an arbitrary sample is measured with a provisional counting time set for each component, and the total analysis time is measured, in the case of continuous measurement of a plurality of samples, as a time from placement of one sample at the measurement position to placement of a next sample at the measurement position and, in the case of measurement of only one sample, as a time from introduction of that sample from outside of the sequential X-ray fluorescence spectrometer to removal of that sample to the outside of the sequential X-ray fluorescence spectrometer; the total non-counting time is calculated by subtracting the total counting time which is a sum of the provisional counting

Assignees

• Rigaku Denki Co Ltd

Inventors

• Kataoka Yoshiyuki
• Nagoshi Yasuhiko

Classifications

• G01N2223/321

  manipulator for positioning a part · CPC title

• G01N2223/32

  adjustments of elements during operation · CPC title

• G01N2223/306

  computer control · CPC title

• G01N2223/1016

  X-ray · CPC title

• G01N2223/611

  patterned objects; electronic devices · CPC title