Drop test device for a micromechanical component
US-2026008671-A1 · Jan 8, 2026 · US
Test apparatus
Test apparatus · Cooperative Patent Classification (CPC)
Separating, mixing, shaping, printing, and transporting materials.
Related technology areas
Mapped technology topics for this CPC code.
| Metric | Value |
|---|---|
| CPC code | B81C99/005 |
| Official title | {Test apparatus} |
| Display label | Test apparatus |
| Total patents | 56 |
Filing trend
Year-over-year patent counts classified under this CPC code.
Filing activity over the last five years is rapidly declining.
| Year | Patents |
|---|---|
| 2015 | 6 |
| 2016 | 11 |
| 2017 | 10 |
| 2018 | 6 |
| 2019 | 9 |
| 2020 | 3 |
| 2021 | 3 |
| 2022 | 2 |
| 2023 | 1 |
| 2024 | 3 |
| 2025 | 1 |
| 2026 | 1 |
Representative patents
Representative publications under this CPC code from precomputed stats, or recent filings when stats are unavailable.
Circuit and method to detect faults of a mems device including an oscillating mass
US-2025007463-A1 · Jan 2, 2025 · US
Decoupled XY parallel micro-positioning stage
US-12106999-B2 · Oct 1, 2024 · US
Microelectromechanical device with test structure, test equipment for testing microelectromechanical devices and method for manufacturing a microelectromechanical device
US-2024175682-A1 · May 30, 2024 · US
Movable device, mems device and optical scanning apparatus
US-2024004185-A1 · Jan 4, 2024 · US
Device and method for monitoring surface condition of contact surface of detected object
US-11634319-B2 · Apr 25, 2023 · US
Testing apparatus and testing method thereof
US-11368804-B1 · Jun 21, 2022 · US
Device and method for monitoring surface condition of contact surface of detected object
US-2022002148-A1 · Jan 6, 2022 · US
Decoupled xy parallel micro-positioning stage
US-2021233800-A1 · Jul 29, 2021 · US
MEMS transducer system and associated methods
US-10972848-B2 · Apr 6, 2021 · US
Apparatus and method for packaging, handling or testing of sensors
US-10935569-B2 · Mar 2, 2021 · US
Apparatus and method for packaging, handling or testing of sensors
US-10782315-B2 · Sep 22, 2020 · US
Sensor characteristic evaluation method and charged particle beam device
US-10737937-B2 · Aug 11, 2020 · US
Mems transducer system and associated methods
US-2020045485-A1 · Feb 6, 2020 · US
MEMS transducer system and associated methods
US-10511923-B2 · Dec 17, 2019 · US
Apparatus and methods for integrated MEMS devices
US-10479676-B2 · Nov 19, 2019 · US
Apparatus and method for testing a capacitive transducer and/or associated electronic circuitry
US-10451667-B2 · Oct 22, 2019 · US
Sensor characteristic evaluation method and charged particle beam device
US-2019292046-A1 · Sep 26, 2019 · US
Controlled pulse generation methods and apparatuses for evaluating stiction in microelectromechanical systems devices
US-10393618-B2 · Aug 27, 2019 · US
Probe card for a magnetically-actuable device and test system including the probe card
US-10364147-B2 · Jul 30, 2019 · US
Frequently asked questions
Answers are generated from the same data shown on this page.
- What is CPC B81C99/005?
- CPC B81C99/005 is the Cooperative Patent Classification code for “Test apparatus.”
- How many patents are filed under CPC B81C99/005 (Test apparatus)?
- Our database includes 56 publications tagged with this CPC code.
- Is patent activity under CPC B81C99/005 growing?
- Publication counts under this code: 3 in 2024 vs 1 in 2025 (latest complete years).