Method for evaluating oxide semiconductor thin film, method for managing quality of oxide semiconductor thin film, and evaluation element and evaluation device used in above evaluation method
US-2016282284-A1 · Sep 29, 2016 · US
Kk Kobe Seiko Sho(Kobe Steel Ltd ) was listed as an assignee on 4 patent publications in 2016.
| Metric | Value |
|---|---|
| Company | Kk Kobe Seiko Sho(Kobe Steel Ltd ) |
| Year | 2016 |
| Patents | 4 |
Representative publications for Kk Kobe Seiko Sho(Kobe Steel Ltd ) in 2016.
US-2016282284-A1 · Sep 29, 2016 · US
US-2016268611-A1 · Sep 15, 2016 · US
US-2016243794-A1 · Aug 25, 2016 · US
US-2016222483-A1 · Aug 4, 2016 · US
Most common classification codes for Kk Kobe Seiko Sho(Kobe Steel Ltd ) in 2016.
| CPC | Patents |
|---|---|
| B29C45/14311 | 1 |
| B29K2705/00 | 1 |
| B32B15/08 | 1 |
| B32B15/085 | 1 |
| B32B15/088 | 1 |
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