Methods and systems for creating or performing a dynamic sampling scheme for a process during which measurements are performed on wafers
US-9651943-B2 · May 16, 2017 · US
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Izikson Pavel patents in 2017
Izikson Pavel was listed as an assignee on 3 patent publications in 2017.
| Metric | Value |
|---|---|
| Company | Izikson Pavel |
| Year | 2017 |
| Patents | 3 |
Patents
Representative publications for Izikson Pavel in 2017.
Top CPC classifications
Most common classification codes for Izikson Pavel in 2017.
| CPC | Patents |
|---|---|
| G03F7/70508 | 1 |
| G03F7/70616 | 1 |
| G03F7/70625 | 1 |
| G03F7/70633 | 1 |
| G05B21/02 | 1 |
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