Methods and systems for creating or performing a dynamic sampling scheme for a process during which measurements are performed on wafers
US-9651943-B2 · May 16, 2017 · US
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Izikson Pavel patents
Izikson Pavel holds 4 patents in our database, with recent filings and technology areas summarized below.
| Metric | Value |
|---|---|
| Total patents | 4 |
| Recent patents | 0 |
| First publication | Jun 9, 2015 |
| Latest publication | May 16, 2017 |
Filing trend
Year-over-year patent counts for this assignee.
Recent patents
Latest publications where this party is an assignee.
Method and system for providing process tool correctables using an optimized sampling scheme with smart interpolation
US-9620426-B2 · Apr 11, 2017 · US
Method and system for providing tool induced shift using a sub-sampling scheme
US-9606453-B2 · Mar 28, 2017 · US
Method and system for providing process tool correctables
US-9052709-B2 · Jun 9, 2015 · US
Notable patents
Representative or frequently cited publications from precomputed assignee stats.
Methods and systems for creating or performing a dynamic sampling scheme for a process during which measurements are performed on wafers
US-9651943-B2 · May 16, 2017 · US
Method and system for providing process tool correctables using an optimized sampling scheme with smart interpolation
US-9620426-B2 · Apr 11, 2017 · US
Method and system for providing tool induced shift using a sub-sampling scheme
US-9606453-B2 · Mar 28, 2017 · US
Method and system for providing process tool correctables
US-9052709-B2 · Jun 9, 2015 · US
Technology areas
Mapped technology topics for this assignee.
| Technology | Patents |
|---|---|
| Electricity | 4 |
| Physics | 3 |
| Cross-Sectional Technologies | 1 |