Specimen potential measuring method, and charged particle beam device
US-9129775-B2 · Sep 8, 2015 · US
Ohashi Takeyoshi was listed as an assignee on 2 patent publications in 2015.
| Metric | Value |
|---|---|
| Company | Ohashi Takeyoshi |
| Year | 2015 |
| Patents | 2 |
Representative publications for Ohashi Takeyoshi in 2015.
Most common classification codes for Ohashi Takeyoshi in 2015.
| CPC | Patents |
|---|---|
| H10P74/203 | 2 |
| B82Y10/00 | 1 |
| B82Y40/00 | 1 |
| G01B15/04 | 1 |
| G01N23/22 | 1 |
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