Inspection apparatus and method for inspecting a component
US-12560562-B2 · Feb 24, 2026 · US
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Bruker Nano Gmbh patents
Bruker Nano Gmbh holds 4 patents in our database, with recent filings and technology areas summarized below.
| Metric | Value |
|---|---|
| Total patents | 4 |
| Recent patents | 2 |
| First publication | Jan 11, 2018 |
| Latest publication | Feb 24, 2026 |
Filing trend
Year-over-year patent counts for this assignee.
Recent patents
Latest publications where this party is an assignee.
Notable patents
Representative or frequently cited publications from precomputed assignee stats.
Inspection apparatus and method for inspecting a component
US-12560562-B2 · Feb 24, 2026 · US
Inspection apparatus and method for inspecting a component
US-2024077438-A1 · Mar 7, 2024 · US
Method and system for determining the position of a radiation source
US-10234282-B2 · Mar 19, 2019 · US
Method and system for determining the position of a radiation source
US-2018010909-A1 · Jan 11, 2018 · US
Technology areas
Mapped technology topics for this assignee.
| Technology | Patents |
|---|---|
| Physics | 4 |