Method for verifying error of digital circuit
US-2017344669-A1 · Nov 30, 2017 · US
US9989655B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-9989655-B2 |
| Application number | US-201514829485-A |
| Country | US |
| Kind code | B2 |
| Filing date | Aug 18, 2015 |
| Priority date | Nov 20, 2012 |
| Publication date | Jun 5, 2018 |
| Grant date | Jun 5, 2018 |
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Described is a chip comprising: a substrate; a logic unit forming an active circuit on the substrate; and a cosmic ray detector embedded in the substrate, the cosmic ray detector to detect a cosmic ray and to generate a signal indicating detection of the cosmic ray, the signal for reducing error in the logic unit.
Opening claim text (preview).
I claim: 1. A semiconductor chip, comprising: a cosmic ray detector comprised of multiple wires that are coupled to a single sense amplifier, an output of the single sense amplifier coupled to a filter, the cosmic ray detector to generate a signal indicating detection of a cosmic ray; and, a logic unit coupled downstream from the filter to reduce error in a region of the semiconductor chip that received the cosmic ray. 2. The semiconductor chip of claim 1 wherein the multiple wires are disposed over 1000s of square microns. 3. The semiconductor chip of claim 1 wherein the sense amplifier is a differential amplifier. 4. The semiconductor chip of claim 3 wherein the logic unit is to roll-back an executing or executed instruction in response to the signal. 5. The semiconductor chip of claim 3 wherein the logic unit is to generate an interrupt in response to the signal. 6. The semiconductor chip of claim 3 wherein the logic unit is to initiate and determine in response to the signal, whether to address at least one of: soft errors in the semiconductor chip; hard errors in the semiconductor chip; or device aging and variation in the semiconductor chip. 7. The semiconductor chip of claim 1 wherein the logic unit further comprises a counter to count a number of times a region of the semiconductor chip has received cosmic rays. 8. A semiconductor chip, comprising: a substrate; multiple wires that are coupled to a single sense amplifier that is also formed on the substrate, the multiple wires to detect a cosmic ray, a filter coupled to the output of the sense amplifier; and, a logic unit to reduce error in a region of active circuits of the semiconductor chip on the substrate that received the cosmic ray. 9. The semiconductor chip of claim 8 , wherein the wires are positioned close enough to detect a cloud of charged particles from the cosmic ray. 10. The semiconductor chip of claim 8 , wherein the multiple wires are positioned over 1000s of square microns. 11. A system comprising: a) a memory unit; b) a processor, coupled to the memory unit, the processor comprising: i) a substrate; ii) an active circuit on the substrate; and, iii) a cosmic ray detector, the cosmic ray detector comprised of multiple wires that are coupled to a single sense amplifier, a filter coupled to the output of the sense amplifier, the cosmic ray detector to generate a signal indicating detection of acosmic ray; iv) a logic unit coupled downstream from the filter to reduce error in a region of the active circuit that received the cosmic ray; and, c) a wireless interface for communicatively coupling the system with another device. 12. The system of claim 11 further comprising a display unit. 13. The system of claim 11 wherein the logic unit is to roll-back an executing or executed instruction according to a level of the sense signal. 14. The system of claim 11 , wherein the multiple wires are positioned close enough to detect a cloud of charged particles from the cosmic ray.
Testing of digital circuits · CPC title
Soft error testing; Soft error rate evaluation; Single event testing · CPC title
Detector read-out circuitry (for processing gain or off-set correction H04N) · CPC title
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