Method to transfer two dimensional film grown on metal-coated wafer to the wafer itself in a face-to-face manner

US9966250B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-9966250-B2
Application numberUS-201715608525-A
CountryUS
Kind codeB2
Filing dateMay 30, 2017
Priority dateAug 5, 2013
Publication dateMay 8, 2018
Grant dateMay 8, 2018

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

A method of in-situ transfer during fabrication of a component comprising a 2-dimensional crystalline thin film on a substrate is disclosed. In one embodiment, the method includes forming a layered structure comprising a polymer, a 2-dimensional crystalline thin film, a metal catalyst, and a substrate. The metal catalyst, being a growth medium for the two-dimensional crystalline thin film, is etched and removed by infiltrating liquid to enable the in-situ transfer of the two-dimensional crystalline thin film directly onto the underlying substrate.

First claim

Opening claim text (preview).

What is claimed is: 1. A method for transferring a thin film to a substrate, comprising: etching a metal catalyst disposed between the thin film and the substrate, wherein the etching simultaneously promotes in-situ face-to-face contact between the crystalline thin film and the substrate without the need to delaminate and transfer the film to the substrate, wherein the in-situ face-to-face contact between the crystalline thin film and the substrate further comprises release of gas bubbles from a subsurface gas source implanted in the substrate. 2. The method of claim 1 , wherein the release of the gas bubbles forms capillary bridges. 3. The method of claim 2 , wherein the capillary bridges progressively replace the etched metal layer at the interface between the crystalline thin film and the substrate in the presence of a fluid infiltrated at the interface. 4. The method of claim 3 , wherein the fluid is selected from the group consisting of an etchant, a solvent and a surface active agent, or a combination thereof. 5. The method of claim 4 , wherein the surface active agent removes creases and ripples in the crystalline thin film.

Assignees

Inventors

Classifications

  • being chalcogenide semiconductor materials not being oxides, e.g. ternary compounds · CPC title

  • Preparation of wafers not covered by a single main group of this subclass, e.g. wafer reinforcement · CPC title

  • introduced into a nitride material, e.g. changing SiN to SiON · CPC title

  • Controlling the interface between substrate and epitaxial layer, e.g. by ion implantation followed by annealing · CPC title

  • Carbon, e.g. diamond-like carbon · CPC title

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What does patent US9966250B2 cover?
A method of in-situ transfer during fabrication of a component comprising a 2-dimensional crystalline thin film on a substrate is disclosed. In one embodiment, the method includes forming a layered structure comprising a polymer, a 2-dimensional crystalline thin film, a metal catalyst, and a substrate. The metal catalyst, being a growth medium for the two-dimensional crystalline thin film, is e…
Who is the assignee on this patent?
Nat Univ Singapore
What technology area does this patent fall under?
Primary CPC classification H10P14/3241. Mapped technology areas include Electricity.
When was this patent published?
Publication date Tue May 08 2018 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 4 related publications on this page (citations in our corpus or others sharing the same primary CPC).