Methods of curing a dielectric layer for manufacture of a semiconductor device

Patent metadata

Field	Value
Publication number	US-9923077-B2
Application number	US-201615093896-A
Country	US
Kind code	B2
Filing date	Apr 8, 2016
Priority date	Apr 17, 2015
Publication date	Mar 20, 2018
Grant date	Mar 20, 2018

Abstract

A method of curing a dielectric layer, such as a dielectric layer that has a relatively small thickness and/or a narrow width or a complicated shape, is provided. The method of curing a dielectric layer for the manufacture of a semiconductor device includes providing the dielectric layer, wherein the dielectric layer is on a semiconductor layer; forming a first metal-containing layer on the dielectric layer; forming a curing atom screening region in an upper portion of the first metal-containing layer by injecting screening atoms onto an upper surface of the first metal-containing layer; injecting curing atoms into the first metal-containing layer through the upper surface of the first metal-containing layer; and flowing the curing atoms into the dielectric layer in an atmosphere at a first temperature.

First claim

What is claimed is:

1. A method of curing a dielectric layer for the manufacture of a semiconductor device, the method comprising:
providing the dielectric layer, wherein the dielectric layer is on a semiconductor layer;
forming a first metal-containing layer on the dielectric layer;
forming a curing atom screening region in an upper portion of the first metal-containing layer by injecting screening atoms onto an upper surface of the first metal-containing layer;
injecting curing atoms into the first metal-containing layer through the upper surface of the first metal-containing layer; and
flowing the curing atoms into the dielectric layer in an atmosphere at a first temperature.

2. The method of claim 1 , further comprising moving defect-inducing atoms existing in the dielectric layer and/or on a surface of the dielectric layer to the first metal-containing layer in an atmosphere at a second temperature, wherein the second temperature is greater than the first temperature.

3. The method of claim 1 , further comprising, after flowing the curing atoms into the dielectric layer,
removing the first metal-containing layer; and
forming a second metal-containing layer on the dielectric layer.

4. The method of claim 3 , wherein the dielectric layer comprises a gate dielectric film, and the second metal-containing layer is a gate electrode.

5. The method of claim 4 , wherein the gate dielectric film and the gate electrode form at least one selected from a planar field effect transistor (FET), a fin-type FET (FinFET), a gate-all-around (GAA) FET, a vertical columnar FET, and a nanowire FET.

6. The method of claim 1 , further comprising, after flowing the curing atoms into the dielectric layer,
forming a second metal-containing layer on the first metal-containing layer.

7. The method of claim 1 , wherein the dielectric layer comprises a first dielectric layer having a first relative dielectric constant and a second dielectric layer on the first dielectric layer, the second dielectric layer having a second relative dielectric constant that is higher than the first relative dielectric constant, and
wherein flowing the curing atoms into the dielectric layer comprises flowing the curing atoms into the second dielectric layer.

8. The method of claim 7 , wherein the second dielectric layer comprises one selected from hafnium oxide, hafnium oxynitride, hafnium silicon oxide, lanthanum oxide, lanthanum aluminum oxide, zirconium oxide, zirconium silicon oxide, tantalum oxide, titanium oxide, barium strontium titanium oxide, barium titanium oxide, strontium titanium oxide, yttrium oxide, erbium oxide, dysprosium oxide, gadolinium oxide, aluminum oxide, lead scandium tantalum oxide, lead zinc niobate, and a combination thereof.

9. The method of claim 1 , wherein the first metal-containing layer is formed in an atmosphere at a third temperature,
wherein forming the curing atom screening region comprises supplying screening atom precursors onto the first metal-containing layer in-situ after forming the first metal-containing layer, and
wherein the screening atom precursors are thermally decomposed at a temperature that is lower than the third temperature.

10. The method of claim 9 , wherein the screening atom precursors are in a gas phase or a liquid phase.

11. The method of claim 9 , wherein the screening atom precursors are silicon chloride, boron chloride, nitrogen fluoride, sulfur fluoride, carbon fluoride, hydrogen bromide, sulfide of cobalt, fluorocarbon, hydrofluorocarbon, methane, ammonia, or titanium tetrachloride.

12. The method of claim 1 , wherein an amount of curing atoms that are injected into the first metal-containing layer is controlled by an amount of screening atoms that are injected into the first metal-containing layer.

13. The method of claim 1 , wherein injecting curing atoms into the first metal-containing layer is performed in an air atmosphere, an oxygen atmosphere, a water vapor atmosphere, a nitrogen atmosphere, or an oxygen and nitrogen atmosphere.

14. The method of claim 1 , wherein the first metal-containing layer comprises one selected from TiN, TaN, W, TiAlC, TaAlC, TaAl, TiAl, HfAl, Al, Ti, WN, Ru, Mo, and a combination thereof.

15. The method of claim 1 , wherein the screening atoms are Si, B, N, S, C, Br, Co, or Ti atoms.

16. The method of claim 1 , wherein the curing atoms are oxygen or nitrogen atoms.

17. The method of claim 16 , wherein the curing atoms are oxygen atoms, and responsive to injecting the curing atoms into the first metal-containing layer, at least a portion of the first metal-containing layer is not oxidized.

18. The method of claim 1 , wherein, responsive to forming the curing atom screening region, a thickness of the first metal-containing layer increases by 5 Å or less.

19. The method of claim 1 , wherein, responsive to injecting the curing atoms into the first metal-containing layer, the curing atoms are not injected into the first metal-containing layer after elapsing of a threshold time.

20. A method of curing a dielectric layer for the manufacture of a semiconductor device, the method comprising:
contacting screening atom precursors to a first metal-containing layer, wherein the first metal-containing layer is on a dielectric layer;
forming a curing atom screening region in an upper portion of the first metal-containing layer in an atmosphere at a first temperature;
injecting curing atoms into the first metal-containing layer; and
flowing the curing atoms into the dielectric layer.

Assignees

• Hwang Yoon Tae
• Yoon Ki Joong
• Park Moon Kyu
• Hyun Sang Jin
• Na Hoon Joo
• Samsung Electronics Co Ltd

Inventors

• Hwang Yoon-Tae
• Yoon Ki-joong
• Park Moon-Kyu
• Hyun Sang-Jin
• Na Hoon-Joo

Classifications

• H10D64/01338

  with a treatment, e.g. annealing, after the formation of the conductor · CPC title

• H01L29/495

  Electricity · mapped topic

• H01L21/28176

  Electricity · mapped topic

• H01L29/78

  Electricity · mapped topic

• H01L29/4966

  Electricity · mapped topic