Wafer rotation in a semiconductor chamber

US9922819B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-9922819-B2
Application numberUS-201715435189-A
CountryUS
Kind codeB2
Filing dateFeb 16, 2017
Priority dateMar 12, 2014
Publication dateMar 20, 2018
Grant dateMar 20, 2018

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

A method and apparatus for processing a substrate are provided. The apparatus includes a pedestal and rotation member, both of which are moveably disposed within a processing chamber. The rotation member is adapted to rotate a substrate disposed in the chamber. The substrate may be supported by an edge ring during processing. The edge ring may selectively engage either the pedestal or the rotation member. In one embodiment, the edge ring engages the pedestal during a deposition process and the edge ring engages the rotation member during rotation of the substrate. The rotation of the substrate during processing may be discrete or continuous.

First claim

Opening claim text (preview).

The invention claimed is: 1. A method of processing a substrate, comprising: depositing a first portion of a film on a substrate in a first position; stopping the deposition of the first portion of the film; engaging a rotation member to rotate the substrate from the first position to a second position different from the first position; and depositing a second portion of the film on the substrate in the second position. 2. The method of claim 1 , further comprising: stopping the deposition of the second portion of the film; engaging the rotation member to rotate the substrate from the second position to a third position different from the first position and the second position; depositing a third portion of the film on the substrate in the third position; stopping the deposition of the third portion of the film; engaging the rotation member to rotate the substrate from the third position to a fourth position different from the first position, the second position, and the third position; and depositing a fourth portion of the film on the substrate in the fourth position. 3. The method of claim 2 , wherein an elevation of the rotation member in each of the first position, the second position, the third position, and the fourth position is the same. 4. The method of claim 3 , wherein the second position is about 90° from the first position. 5. The method of claim 3 , wherein the third position is about 90° from the second position. 6. The method of claim 3 , wherein the fourth position is about 90° from the third position. 7. The method of claim 1 , wherein the substrate is disposed on an edge ring. 8. The method of claim 7 , wherein the engaging the rotation member to rotate the substrate further comprises: lowering a pedestal out of contact with an edge ring; and rotating the rotation member. 9. The method of claim 1 , wherein the substrate is disposed on a pedestal during the depositing a first portion of the film and the depositing a second portion of the film. 10. The method of claim 1 , wherein the substrate is supported by an edge ring during the rotating the substrate. 11. A method of processing a substrate, comprising: contacting an edge ring disposed in a process chamber with a pedestal; elevating the pedestal and the edge ring to a processing position; depositing a film on a substrate, wherein the substrate is disposed on the edge ring located in the processing position during the deposition; contacting the edge ring with a rotation member and lowering the pedestal from the processing position, wherein the edge ring is spaced from the pedestal when the pedestal is lowered; and rotating the rotation member while in contact with the edge ring. 12. The method of claim 11 , wherein the lowering the pedestal comprises decoupling the pedestal from the edge ring by a distance of between about 0.01 inches and about 1 inch. 13. The method of claim 11 , wherein the depositing a film on the substrate and the rotating the rotation member are performed sequentially. 14. The method of claim 11 , wherein the depositing a film on the substrate and the rotating the rotation member are performed simultaneously. 15. The method of claim 11 , further comprising: heating the substrate during the depositing a film on the substrate via a heater disposed in the pedestal. 16. A method of processing a substrate, comprising: engaging an edge ring disposed in a process chamber with a rotation member; elevating the rotation member to engage a shadow ring with the edge ring; elevating a pedestal to engage the edge ring having the shadow ring disposed thereon; performing a deposition process while the edge ring is disposed on the pedestal; disengaging the pedestal from the edge ring by lowering the pedestal; rotating the rotation member to rotate the edge ring and the shadow ring; and reengaging the edge ring by elevating the pedestal to contact the edge ring. 17. The method of claim 16 , wherein the shadow ring is supported by an electrode when the edge ring is disengaged from the shadow ring. 18. The method of claim 16 , wherein the performing a deposition process and the rotating the rotation member are performed sequentially. 19. The method of claim 16 , wherein the performing a deposition process and the rotating the rotation member are performed simultaneously. 20. The method of claim 16 , wherein the edge ring and the shadow ring are rotated between about 30° and about 270° during rotation of the rotation member.

Assignees

Inventors

Classifications

  • characterised by the construction of the shaft · CPC title

  • characterised by a movable susceptor, stage or support, others than those only rotating on their own vertical axis, e.g. susceptors on a rotating carrousel · CPC title

  • characterised by lifting arrangements, e.g. lift pins · CPC title

  • characterised by edge profile or support profile · CPC title

  • mainly by conduction · CPC title

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What does patent US9922819B2 cover?
A method and apparatus for processing a substrate are provided. The apparatus includes a pedestal and rotation member, both of which are moveably disposed within a processing chamber. The rotation member is adapted to rotate a substrate disposed in the chamber. The substrate may be supported by an edge ring during processing. The edge ring may selectively engage either the pedestal or the rotat…
Who is the assignee on this patent?
Applied Materials Inc
What technology area does this patent fall under?
Primary CPC classification H10P72/7618. Mapped technology areas include Electricity.
When was this patent published?
Publication date Tue Mar 20 2018 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).