Multilayer ceramic capacitor
US-9666371-B2 · May 30, 2017 · US
Dielectric material for multilayer ceramic capacitor, and multilayer ceramic capacitor
US9919970B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-9919970-B2 |
| Application number | US-201615364175-A |
| Country | US |
| Kind code | B2 |
| Filing date | Nov 29, 2016 |
| Priority date | Dec 1, 2015 |
| Publication date | Mar 20, 2018 |
| Grant date | Mar 20, 2018 |
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Abstract
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Dielectric layers are prepared using a dielectric material that contains a ceramic powder having Ba, Ti, and additive element X which is solid-solubilized and is at least one element selected from the group consisting of Mo, Ta, Nb, and W, wherein the standard deviation of the ratio of the peak intensity of the additive element X (XKα) measured by STEM-EDX, and the sum of the peak intensity of the Ti and peak intensity of the Ba (BaLα+TiKα) measured by STEM-EDX, is less than 10.5% of the average ratio as measured at a total of five points including the three points that divide the maximum diameter of one grain of the ceramic powder into four equal parts, and two excluding the center point of the three points that divide the diameter crossing at right angles with the maximum diameter at its center point, into four equal parts.
First claim
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We claim: 1. A multilayer ceramic capacitor having a laminate constituted by pairs of internal electrode layers of different polarities that are stacked alternately together with a dielectric layer between each pair, wherein said multilayer ceramic capacitor is characterized in that the dielectric layers are sintered bodies made of a dielectric material that contains a ceramic powder having Ba, Ti, and additive element X which is solid-solubilized and is at least one element selected from the group consisting of Mo, Ta, Nb, and W, wherein a standard deviation of a ratio of a peak intensity of the additive element X (XKα) measured by STEM-EDX (scanning electron microscopy/energy-dispersive X-ray analysis), and the sum of a peak intensity of the Ti and a peak intensity of the Ba (BaLα+TiKα) measured by STEM-EDX, is less than 10.5% of the average ratio as measured at a total of five points composed of three points that divide a maximum diameter of one grain of the ceramic powder into four equal parts, and two excluding a center point of three points that divide a diameter crossing at right angles with the maximum diameter, at its center point, into four equal parts. 2. A multilayer ceramic capacitor according to claim 1 , characterized in that the dielectric layers are sintered bodies made of a dielectric material, wherein 80 percent by quantity or more of its ceramic powder is accounted for by gains whose standard deviation of the ratio of the peak intensity of the additive element X (XKα) measured by STEM-EDX, and the sum of the peak intensity of the Ti and peak intensity of the Ba (BaLα+TiKα) measured by STEM-EDX, is less than 10.5% of the average ratio as measured at a total of five points including the three points that divide the maximum diameter of the grain into four equal parts, and two excluding the center point of the three points that divide the diameter crossing at right angles with the maximum diameter at its center point, into four equal parts. 3. A multilayer ceramic capacitor according to claim 1 , wherein the amount of additive element X in the dielectric layers is 0.05 to 0.3 mol per 100 mol of Ti. 4. A multilayer ceramic capacitor according to claim 2 , wherein the amount of additive element X in the dielectric layers is 0.05 to 0.3 mol per 100 mol of Ti.
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Classifications
Barium oxides or oxide-forming salts thereof · CPC title
Electrodes · CPC title
- C04B35/4682Primary
based on BaTiO3 perovskite phase · CPC title
Tungsten oxides, tungstates, or oxide-forming salts thereof · CPC title
Molybdenum oxides, molybdates or oxide forming salts thereof, e.g. cadmium molybdate · CPC title
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- What does patent US9919970B2 cover?
- Dielectric layers are prepared using a dielectric material that contains a ceramic powder having Ba, Ti, and additive element X which is solid-solubilized and is at least one element selected from the group consisting of Mo, Ta, Nb, and W, wherein the standard deviation of the ratio of the peak intensity of the additive element X (XKα) measured by STEM-EDX, and the sum of the peak intensity of …
- Who is the assignee on this patent?
- Taiyo Yuden Kk
- What technology area does this patent fall under?
- Primary CPC classification C04B35/4682. Mapped technology areas include Chemistry & Metallurgy.
- When was this patent published?
- Publication date Tue Mar 20 2018 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
- What related patents are in patentsdb?
- We list 3 related publications on this page (citations in our corpus or others sharing the same primary CPC).