Substrate polishing apparatus with contact extension or adjustable stop
US-11904429-B2 · Feb 20, 2024 · US
US9902037B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-9902037-B2 |
| Application number | US-201514931610-A |
| Country | US |
| Kind code | B2 |
| Filing date | Nov 3, 2015 |
| Priority date | Oct 24, 2011 |
| Publication date | Feb 27, 2018 |
| Grant date | Feb 27, 2018 |
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An electronic grade glass substrate is provided with a recess, channel or step in one surface, and a first chamfer between the side surface of the recess, channel or step and the one surface. The side and bottom surfaces of the recess, channel or step are mirror finished, and the first chamfer is mirror finished.
Opening claim text (preview).
The invention claimed is: 1. A method for manufacturing an electronic grade synthetic quartz glass substrate, comprising the steps of: machining at least one surface of a glass substrate to form a recess, channel or step in the one surface, the recess, channel or step having side and bottom surfaces, and to form at least one chamfer selected from among a first chamfer between the side surface of the recess, channel or step and the one surface of the substrate, a second chamfer between the side and bottom surfaces of the recess, channel or step, the second chamfer being a curved surface having a radius of curvature of 0.1 to 5.0 mm, and a third chamfer between the bottom surface of the step and an end surface of the substrate, and polishing the side and bottom surfaces of the recess, channel or step and the chamfers to mirror finish by a working portion of a rotary polishing tool having a Young's modulus of up to 7 GPa while keeping the working portion in contact with the side and bottom surfaces and the chamfers under independent constant pressures. 2. The method of claim 1 wherein the mirror finish polishing step includes keeping the working portion of the rotary polishing tool in contact with the bottom and side surfaces of the recess, channel or step and the chamfers under independent constant pressures in the range of 1 to 1,000,000 Pa. 3. The method of claim 1 wherein in the mirror finish polishing step, the working portion of the rotary polishing tool is kept in concurrent contact with the bottom and side surfaces of the recess, channel or step and the chamfers under independent pressures. 4. The method of claim 1 wherein in the mirror finish polishing step, the rotary polishing tool and the substrate are relatively moved such that the working portion may follow the profile of the recess, channel or step and the chamfers in the substrate. 5. The method of claim 4 wherein in the mirror finish polishing step, the rotary polishing tool is rotated about the recess or a substrate-holding platform is rotated such that the working portion may follow the profile of the recess, channel or step and the chamfers in the substrate.
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