Infrared-ray sensing device

Patent metadata

Field	Value
Publication number	US-9899549-B2
Application number	US-201715585738-A
Country	US
Kind code	B2
Filing date	May 3, 2017
Priority date	Jun 14, 2016
Publication date	Feb 20, 2018
Grant date	Feb 20, 2018

Abstract

An infrared-ray sensing device includes a support and a plurality of photodiodes disposed on the support. Each photodiode of the plurality includes a first mesa including a first semiconductor layer of a first conductivity type, a second semiconductor layer of the first conductivity type, a third semiconductor layer of a second conductivity type that is disposed between the first and second semiconductor layers, and a super-lattice region disposed on the support along a reference plane. The third semiconductor layer and the super-lattice region are provided in common for the photodiodes of the plurality. In the photodiodes, the first mesas and the second semiconductor layers are aligned along a first axis intersecting the reference plane so that each of the second semiconductor layers is provided in a position corresponding to the position of its first mesa. Each second semiconductor layer is disposed between the third semiconductor layer and the super-lattice region.

First claim

What is claimed is:

1. An infrared-ray sensing device comprising:
a support having a principal surface; and
a plurality of photodiodes disposed on the principal surface of the support,
wherein each photodiode of said plurality of photodiodes includes:
a first mesa including a first semiconductor layer of a first conductivity type,
a second semiconductor layer of the first conductivity type,
a third semiconductor layer of a second conductivity type that is disposed between the first semiconductor layer and the second semiconductor layer, and
a super-lattice region disposed on the principal surface of the support along a reference plane,

wherein the third semiconductor layer and the super-lattice region are provided in common for said plurality of photodiodes, and
wherein, in the photodiodes of said plurality,
the first mesas and the second semiconductor layers are aligned along a first axis intersecting the reference plane so that each of the second semiconductor layers is provided in a position corresponding to the position of a first mesa, and
the second semiconductor layer is disposed between the third semiconductor layer and the super-lattice region.

2. The infrared-ray sensing device according to claim 1 , wherein, in the photodiodes of said plurality,
the first semiconductor layer in the first mesa is in contact with the third semiconductor layer so as to form a first p-n junction at an interface between said first semiconductor layer and the third semiconductor layer, and
the second semiconductor layer is in contact with the third semiconductor layer so as to form a second p-n junction at an interface between said second semiconductor layer and the third semiconductor layer.

3. The infrared-ray sensing device according to claim 1 , wherein, in the photodiodes of said plurality,
the first semiconductor layer in the first mesa reaches a side surface of said mesa,
the side surface of said mesa is covered with an insulating film, and
said mesa has a bottom in the third semiconductor layer.

4. The infrared-ray sensing device according to claim 1 , wherein
each photodiode of said plurality of photodiodes further includes a second mesa including the second semiconductor layer, and, in each said photodiode,
the third semiconductor layer is disposed on a surface of the super-lattice region, a side surface of the second mesa thereof and an upper surface of the second mesa thereof so as to embed the second mesa thereof with the third semiconductor layer.

5. The infrared-ray sensing device according to claim 4 , wherein
each first mesa has a height larger than a thickness of each first semiconductor layer,
each second mesa has a height equal to or larger than a thickness of each second semiconductor layer,
each first semiconductor layer in each first mesa is in contact with the third semiconductor layer so as to form a first p-n junction at side and bottom surfaces of each said first semiconductor layer, and
each second semiconductor layer in each second mesa is in contact with the third semiconductor layer so as to form a second p-n junction at side and upper surfaces of each said second semiconductor layer.

6. The infrared-ray sensing device according to claim 1 , wherein
each second semiconductor layer contains InGaAs with p-type conductivity, and
the InGaAs has a p-type impurity concentration in a range of 5×10 15 cm −3 or more and 5×10 16 cm −3 or less.

7. The infrared-ray sensing device according to claim 1 , wherein
the super-lattice region includes a semiconductor containing antimony as a constituent element,
each second semiconductor layer contains an InGaAs/GaAsSb super-lattice with p-type conductivity, and
the InGaAs/GaAsSb super-lattice of each said second semiconductor layer has a p-type impurity concentration in a range of 5×10 15 cm ×3 or more and 5×10 16 cm −3 or less.

8. The infrared-ray sensing device according to claim 1 ,
wherein the third semiconductor layer contains n-type InGaAs,
the first conductivity type of each second semiconductor layer is p-type conductivity, and
the third semiconductor layer is in contact with each second semiconductor layer so as to form p-n junctions at an interface between the third semiconductor layer and each said second semiconductor layer.

9. The infrared-ray sensing device according to claim 1 ,
wherein the super-lattice region includes a multi quantum well structure including an InGaAs/GaAsSb super-lattice.

Assignees

• Sumitomo Electric Industries

Inventors

• Machinaga Kenichi
• Iguchi Yasuhiro
• Kawahara Takahiko

Classifications

• H01L31/03046

  Electricity · mapped topic

• H01L27/14694

  Electricity · mapped topic

• H01L31/035236 Primary

  Electricity · mapped topic

• H01L27/14649

  Electricity · mapped topic

• H10F77/1248

  having three or more elements, e.g. GaAlAs, InGaAs or InGaAsP · CPC title