Semiconductor transistor device and method for fabricating the same

US9893066B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-9893066-B2
Application numberUS-201715432165-A
CountryUS
Kind codeB2
Filing dateFeb 14, 2017
Priority dateOct 5, 2015
Publication dateFeb 13, 2018
Grant dateFeb 13, 2018

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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Abstract

Official abstract text for this publication.

A semiconductor transistor device includes an oxide semiconductor layer having an active surface, a source electrode, a drain electrode, a gate electrode and a control capacitor. The gate electrode, the source electrode and the drain electrode are directly in contact with the active surface. The gate electrode is disposed between the drain electrode and the source electrode. The gate electrode, the source electrode and the drain electrode are separated from each other. The control capacitor is electrically connected to the gate electrode through a connection.

First claim

Opening claim text (preview).

What is claimed is: 1. A method for fabricating a semiconductor transistor device, comprising: forming an oxide semiconductor layer having an active surface; forming a source electrode, a drain electrode and a gate electrode separated from each other and directly in contact with the active surface, wherein the gate electrode is disposed between the drain electrode; and forming a control capacitor to electrically connect to the gate electrode through a connection. 2. The method according to claim 1 , wherein the gate electrode, the source electrode, and the drain electrode are formed on a substrate; and the oxide semiconductor layer is formed on the gate electrode, the source electrode, and the drain electrode, so as to make the active surface facing the substrate. 3. The method according to claim 1 , wherein the oxide semiconductor layer is formed on a substrate, and the source electrode, and the drain electrode are formed on the active surface departs from the substrate. 4. The method according to claim 1 , further comprising steps of forming a conductive layer on one side of the oxide semiconductor layer opposite to the active surface. 5. The method according to claim 1 , further comprising steps of forming a directive current (DC) circuit or a radio frequency (RF) circuit electrically connected to the control capacitor.

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What does patent US9893066B2 cover?
A semiconductor transistor device includes an oxide semiconductor layer having an active surface, a source electrode, a drain electrode, a gate electrode and a control capacitor. The gate electrode, the source electrode and the drain electrode are directly in contact with the active surface. The gate electrode is disposed between the drain electrode and the source electrode. The gate electrode,…
Who is the assignee on this patent?
United Microelectronics Corp
What technology area does this patent fall under?
Primary CPC classification H01L27/1052. Mapped technology areas include Electricity.
When was this patent published?
Publication date Tue Feb 13 2018 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 2 related publications on this page (citations in our corpus or others sharing the same primary CPC).